White light interference film thickness gauge

NegotiableUpdate on 02/09

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

NS-20 AcuiTik is a cost-effective white light interference film thickness gauge that uses the optical interference principle of vertically incident high stability wideband light to measure the thickness, reflectivity, and refractive index of transparent or semi transparent film layers at the nanometer to micrometer level. Featuring domestically produced software and hardware, high precision and stability, non-contact measurement, and intelligent algorithms, it is suitable for measuring multi-layer composite thin films.

Product Details

The NS-20 white light interference film thickness gauge (domestically developed and independently controllable) is a desktop manual film thickness measurement and analysis system that can be used for coating thickness monitoring and measurement. While ensuring overall compactness and lightness, its accuracy and stability remain unchanged. Having all the algorithm software functions of the NanoSense series, it offers high cost-effectiveness.

　　1、 Core principle:

The vertically incident high stability wideband light is incident on the surface of the sample, causing optical interference between the various film layers. The reflected light can be analyzed by spectroscopy and regression algorithms to calculate the thickness of each layer of the film. Suitable for measuring the thickness, reflectivity, refractive index, and other parameters of transparent or semi transparent film layers ranging from nanometer to micrometer levels.

　　2、 Product Features:

1. Measurement range: capable of measuring film thickness, refractive index, and reflectivity from 1 nanometer to 250 micrometers.

2. Non contact measurement: can measure hard materials, soft materials, or samples with easily damaged surfaces.

3. Multi layer film measurement capability: It can measure the thickness of each layer of multi-layer composite films.

4. High precision, high stability: sub nanometer thickness measurement accuracy, static stability can reach 0.02 nanometers.

5. Intelligent algorithm: Core IP algorithm, one click measurement of large-span film thickness, greatly simplifying the measurement process.

6. Featured software features: Our self-developed PolarX analysis software includes functions such as formula prediction verification, special material kneading, etc.

　　3、 Core functions:

　　4、 Actual test results show:
光学非接触手动薄膜膜厚测厚仪实测结果展示

　　5、 Special note:

1. Manual measurement, high flexibility;

2. Customizable portable carrying case for film thickness analysis anytime, anywhere;

3. Optional large-sized sample stage;

　　6、 NS-20 series parameter specifications for the Xishi film thickness gauge:

参数规格