Measurement of ultra-thin oil film thickness

NegotiableUpdate on 02/09

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

NS Vista reflection transmission measurement dual channel film thickness gauge is an advanced desktop thin film thickness measurement and analysis system. It has the ability to measure both reflectivity and transmittance simultaneously, making it extremely powerful when measuring samples with high or low reflectivity.

Product Details

NS Vista Reflection Transmission Measurement Dual Channel Film Thickness Gauge（Ultra thin oil film thickness measurement is an advanced desktop thin film thickness measurement and analysis system. It has the ability to measure both reflectivity and transmittance simultaneously, making it extremely powerful when measuring samples with high or low reflectivity. In addition, the Vista Learning algorithm is designed specifically for measuring application scenarios with very rough and thick surfaces. The spot size of the reflection channel can be easily adjusted from 1.5 millimeters to 0.2 millimeters, greatly expanding the application range of thickness measurement. As a desktop device, NS Vista represents advanced technology in this field.

国家实验室膜厚测量解决方案

1、 Features of NS Vista Reflection Transmission Measurement Dual Channel Film Thickness Gauge:

1. Dual channel simultaneous measurement of reflectivity and transmittance can be used to calculate thickness;

2. The ability to measure high reflectivity and low reflectivity samples makes it easier to measure the film thickness of glass substrates;

3. 0.2mm to 1.5mm spot ultra wide dynamic adjustment range;

4. The Vista Learning algorithm is designed specifically for measuring application scenarios with extremely rough and thick surfaces;

2、 Parameter specifications:

参数规格

1. Depending on the specific material;

2. Si/SiO2 (500~1000nm) standard sample;

3. Calculate the 1-fold standard deviation of 100 measurements of 500nm SiO2 standard plate, and take the average of the 1-fold standard deviation of 20 effective measurement days;

4. Calculate the average value of 100 measurements of 500nm SiO2 standard plate, and double the standard deviation of the average value of 20 effective measurement days.