Suzhou Xishi Technology Co., Ltd. was jointly founded by doctoral and master's students from universities such as Berkeley, Fudan University, Shanghai Jiao Tong University, and ShanghaiTech University in the United States. With years of industry experience in the field of film thickness measurement equipment technology, the company has achieved nationwide production and research of its products, which are fully independent and controllable. The company focuses on white light interference film thickness technology and elliptical polarization measurement technology, which play a crucial role in precision manufacturing and scientific research. The product line of Xishi Technology covers various devices such as desktop film thickness gauges, vacuum film thickness gauges, handheld film thickness gauges, and high-speed line scanning film thickness gauges. These devices have been successfully put into the market and have been widely used. The company's products have high precision and stability, meeting the needs of various application scenarios such as semiconductors, display panels, photovoltaics, hard films, and anti reflective coatings.