SE-PV spectroscopic ellipsometer (photovoltaic)

I. Overview

The SE-PV series is a photovoltaic specific spectroscopic ellipsometer launched by Yiguang Technology. Based on rotation compensator modulation technology, it can obtain polarization signals such as Psi/Delta and N/C/S at once. This instrument can achieve rapid characterization of film thickness and optical constants of textured and non textured samples in the photovoltaic industry. SE-PV adopts a high-power light source and is equipped with a brand new optical path design, which can significantly improve the signal-to-noise ratio of the detection signal. It adopts a horizontal/inclined integrated sample stage, which can quickly and easily switch measurement modes to complete the measurement of textured and non textured samples.

2、 Product Features

■ Dual rotation compensator configuration

Quickly switch measurement modes (one click switching)

3、 Product application

The design of SE-PV can meet the measurement requirements of thin films on suede substrates. As shown in the sample below, the design of suede and its surface anti reflective film layer is aimed at reducing the reflection of sunlight on the surface of the solar cell, which weakens the detection signal and greatly increases the difficulty of optical measurement.

Technical Specifications