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Daimei Instrument Technology Service (Shanghai) Co., Ltd
Optical microscope adapter
NegotiableUpdate on 12/23
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Overview
FR uProbe LC: can measure spot sizes as small as a few micrometers for applications such as micro patterned surfaces, samples with high roughness surfaces, etc. With just one click of the mouse, it can measure film thickness, optical constants, reflectivity, transmittance, and absorbance in small areas within the Vis/NIR wavelength range
Product Details
Introduction:
FR-uProbe-LC, Simply connect to the C-Mount adapter for most commercially available optical microscopes (reflectivity and/or transmittance) to provide:
Real time spectral measurement within the wavelength range supported by the microscope
Measurement of film thickness, optical properties, and non-uniformity
O Use integrated, USB connected high-resolution and high-quality color cameras for imaging
O Not affected by the performance of the microscope itself
The spot size (the area where reflectance or transmittance signals are collected) is defined by the aperture size and objective magnification, and can be as small as 2 μ m
Application:
o University&Research Laboratory
Semiconductor (oxide, nitride, Si, resist, etc.)
MEMS devices (photoresist, silicon film, etc.)
LCD display LED
Data storage
Anodizing
Hard/soft coating on curved substrate
Polymer coatings, adhesives, etc
Biomedical (poly (p-xylene), catheter wall thickness, etc.)
Contact us for your application requirements
Feature:
oclickAnalysis (without initial requirement)value）
oCan dynamically measure continuously
Measure n&k, color coordinates
Built in database with over 700 types of materials
Multiple installations for offline analysis
Free software updates
Specifications:
The measurement area spot (the area where the reflected signal is collected) is related to the objective lens and aperture size. The standard aperture sizes are: 500 μ m (square), 250 μ m (square), 100 μ m (square). 250 μ m is the default aperture value Other aperture sizes available upon request: 150 μ m (square) and 50 μ m (square)
Measurement principle:
