Welcome Customer !

Membership

Help

Suzhou Xishi Technology Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products
Product Categories

Suzhou Xishi Technology Co., Ltd

  • E-mail

    frank.yang@acuitik.com

  • Phone

    13817395811

  • Address

    4th Floor, No. 298 Xiangke Road, Pudong New Area, Shanghai

Contact Now

Manual thin film thickness gauge

NegotiableUpdate on 02/09
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin
Overview
The NS-20/NS-20 Pro desktop manual film thickness gauge is a desktop manual film thickness measurement and analysis system. While ensuring overall compactness and lightness, its accuracy and stability remain unchanged. Having all the algorithm software functions of the NanoSense series, it offers high cost-effectiveness.
Product Details
NS-20UV is a high-precision desktop manual film thickness gauge(Domestic benchmark Filmetrics F20 film thickness gauge)It is based on white light interference technology and is very suitable for rapid, non-contact film thickness analysis in laboratories or production lines.
NS-20/NS-20 Pro桌面式手动膜厚仪
  1、 Specific specifications
-Model: NS-20UV
-Measurement principle: White light interference
-Operation mode: desktop manual
-Wavelength range: 190 nm -1100 nm
-Thickness measurement range: 1 nm -40 μ m
-Measurement accuracy: 1 nm or 0.2%
-Measurement accuracy: 0.02 nm
-Single measurement speed:<1 second
-Spot size: 1.5 mm
-Light source type: halogen tungsten lamp+deuterium lamp
  2、 Main characteristics of the instrument
1. Localization and automatic calibration: The software and hardware of NS-20UV have been developed and produced nationwide, with automatic calibration function, reducing the trouble of frequent manual calibration and supporting long-term stable operation.
2. Non contact and high stability: Non contact measurement is used, which will not damage the surface of the sample. The instrument has sub nanometer level accuracy and very high static stability (0.02 nm), especially suitable for measuring soft or easily damaged samples.
3. Multilayer film and intelligent algorithm: capable of measuring the thickness of each layer in multi-layer composite films. Its core algorithm can measure film thickness with a large span in one click, simplifying the operation process.
4. Flexible and portable: As a manual measurement system, it has high flexibility and can be customized into a portable carrying case for easy measurement in different places.
  3、 Application Fields
This instrument is widely used in fields that require precision film thickness detection, including semiconductor manufacturing, display panels, photovoltaic industry, optical coatings, and academic research.