Welcome Customer !

Membership

Help

Funa Scientific Instruments (Shanghai) Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products

Funa Scientific Instruments (Shanghai) Co., Ltd

  • E-mail

    info@phenom-china.com

  • Phone

    18516656178

  • Address

    Room T5705, Shanghai Hongqiao Libao Plaza, No. 88 Shenbin Road, Hongqiao Town, Minhang District, Shanghai

Contact Now

Instrument surface particle analyzer

NegotiableUpdate on 12/28
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin
Overview
Fastmicro Instrument Surface Particle Analyzer is a surface contamination detection tool based on "tape adhesion" sampling technology, which can identify particle pollutants as small as 0.5um through indirect measurement. The dedicated PMC sampling card equipped with it can achieve flexible sampling on various surfaces (including hard to reach areas and high roughness surfaces) without leaving detectable traces. This device can complete the analysis of a 225 mm2 sampling area within seconds, ensuring fast and accurate detection results. Paired with a 2-inch wafer holder, it can also detect settling particles to meet complex cross industry requirements
Product Details

FastmicroInstrument surface particle analyzer(SAS)


FastmicroInstrument surface particle analyzer, is a surface pollution detection tool based on "tape adhesion" sampling technology, which can identify particle pollutants as small as 0.5um through indirect measurement. The dedicated PMC sampling card equipped with it can achieve flexible sampling on various surfaces (including hard to reach areas and high roughness surfaces) without leaving detectable traces. This device can complete the analysis of a 225 mm2 sampling area within seconds, ensuring fast and accurate detection results. Paired with a 2-inch wafer holder, it can also detect settling particles, meeting the detection needs of complex cross industry scenarios.


Product Features

  • Compliant with ISO 14644-9 standard: Generate certified PDF reports in the user interface

  • Detection range: capable of detecting particles as low as 0.5 μ m

  • Stability: 90% collection efficiency |>90% repeatability

  • Quick: Complete detection in 10 seconds


Complete surface cleanliness measurement within seconds

Quick:Imaging only takes a few seconds

Quantitative:Traceable quantitative results

Easy to operate:The operation result is not affected by the operator

Real time judgment for production line quality control

• For further data analysis by R&D personnel

• Used for monitoring, rapid validation, and statistical process control

Accurate:High resolution measurement (quantity, position, size)

stable:High repeatability of multiple measurement results

High throughput:Provide immediate qualified/unqualified results

仪器表面颗粒物分析仪

Surface Particle Analyzer (SAS)

This departmentThis instrument indirectly measures the level of surface particle contamination through a sampler. Convenient to use samplerUsers can collect particulate pollution samples on various products and components at any time.


Using a sampler for indirect measurement

Using a sampler can even perform sampling on hard to reach areas and relatively rough surfacesBy measurement. The sampler (from a certified supplier) will not cause cross contamination.


The analyzer can complete the detection of the sampler within seconds, which makes the testing workflow controllableWithin one minute. The sampler can be transported, remeasured, and inserted into the sampler bracketStep analysis.


There are multiple sampler options available, including adhesive samplers (including brackets) for indirect detection and2-inch wafer kit for dust detection.

This adaptability makes it suitable for crossing multiple rowsDifferent testing scenarios in the industry can provide reliable measurement data and in-depth insights into pollution levels.