Phenom Pharos G2Feina desktop field emission scanning electron microscope | Research grade desktop electron microscope

Phenom Pharos G2It is the second generation launched by Funa in the NetherlandsSchottky field emission electron source desktop scanning electron microscope(Desktop field emission SEM). Equipment setBack scattered electron imaging (BSE)+secondary electron imaging (SE)+integrated energy dispersive spectroscopy (EDS) analysisIntegrating high resolution, high efficiency, and full automation for scientific research level microscopic characterization.

Thanks to the high brightness Schottky field emission electron source, Phenom Pharos G2Clear images can still be obtained under low voltage conditionsSignificantly reducing sample damage and electron beam penetration, very suitableInsulation materials, electron beam sensitive samples, biomaterials, polymersMicroscopic analysis in various fields.

Product Highlights | Optimal Selection of Research Grade Desktop Scanning Electron Microscopes

1. A true field emission level desktop electron microscope

• adoptHeat field emission electron source (Schottky FEG)

• High brightness, high stability, long lifespan, suitable for long-term scientific research experiments

2. High resolution imaging performance

• Resolution better than1.5 nm

• Fine surface structure can still be preserved in imaging under low voltage

• More realistic restoration of sample morphology of nanomaterials, metals, semiconductors, polymers, etc

3. Multi mode imaging+energy spectrum integration

• Backscattered Electron Imaging (BSE)

• Secondary Electronic Imaging (SE)

• Integrated energy dispersive spectroscopy (EDS) (high-speed stability)

• One device can complete itMorphological and compositional analysis

4. Easy to operate and quick to get started

• Automated design, 30 minutes to get started

• Color optical microscope panoramic navigation for more intuitive positioning

• integrationAutomatic Motor Sample StandNo threshold for operation

User Experience Upgrade | Suitable for Laboratories, R&D Centers, Production Quality Inspection

5. Fast, easy, and no need to spray gold

• Built in vacuum lock,15 secondsVacuum extraction can be completed

• Directly observe non-conductive samples without the need for metal coating treatment

• More friendly to electron beam sensitive samples

6. High stability and earthquake resistant design

• built-in27 sets of independent shock absorption modules

• No need for additional seismic platforms, suitable for school laboratories, corporate R&D rooms, and small office areas

7. Maintenance free electronic optical path

• No adjustment, no centering, no maintenance required

• Ensure imaging consistency and significantly reduce maintenance difficulty

Low maintenance cost | Suitable for high-frequency use in scientific research and engineering scenarios

The Feina desktop scanning electron microscope is used for itsStable, durable, and highly automatedIts characteristics are widely used in research institutes, material research and development, lithium battery industry, semiconductor testing, quality analysis and other fields.

• Long lifespan and stable performance of the filament

• The electron microscope system is equipped with hardware security protection to avoid damage caused by misoperation

• Free remote network diagnosis

• Post maintenance is simple, and the total cost is significantly lower than that of traditional ground-based field emission electron microscopes

  
  

Applicable application areas

• Materials Science (Metals, Ceramics, Polymers, Composite Materials)

• Analysis of lithium battery materials and positive and negative electrode powders

• Semiconductor, Microelectronics, and Wafer Defect Detection

• Biomaterials, tissue structure, and micro/nano structure analysis

• Surface engineering, coating, and film research

• Industrial Quality Inspection and Failure Analysis

Why choose Phenom Pharos G2?

✔ Research grade imaging quality
✔ Desktop level volume, no need for computer room
✔ High degree of automation, zero threshold for operation
✔ Low maintenance cost and high reliability
✔ One machine completes morphology and element analysis

To obtainFeina desktop field emission scanning electron microscope | Research grade desktop electron microscopeTechnical parameters, configuration list, application cases or quotationsWelcome to contact us: