Domestic model Feina desktop scanning electron microscope energy dispersive spectrometer

Desktop scanning electron microscope quotationProduct performance

Phenom ProX domestic modelFeina desktop scanning electron microscope energy dispersive spectrometerSimultaneously possessing the ability to observe the microstructure of sample surfaces and analyze surface element composition points, lines, and surfaces. Professor Karel Mast, a former scientist at Philips, teamed up with Fina from the Netherlands to integrate electron microscopy and spectroscopy into one device during production. Later, the operation was controlled through a software platform, and users only need to be familiar with one software to simultaneously operate two functions, making it relatively simple and fast.

Phenom ProX electron microscopy spectroscopy was awarded the 2012 New Product Award, marking a milestone in the scanning electron microscopy spectroscopy industry. The brightness is 10 times that of tungsten filament CeB6 filament, which not only provides high resolution for Phenom ProX electron microscopy spectrometer, but also makes surface element analysis more accurate and fast. The backscattered electron image presents different elements with different gray levels. The SDD X-ray probe equipped with Phenom ProX qualitatively and semi quantitatively detects the point, line, and surface distribution of elements 5-98.

The Phenom ProX electron microscopy spectrometer has the characteristics of fully automatic operation of the Feina series, 15 second rapid vacuum pumping, non gold spraying observation of insulators, and 2-3 year filament replacement. It does not require a shock resistant environment and can be placed on any floor. The energy spectrum has no external components and does not require liquid nitrogen cooling.

Phenom ProX domestic modelFeina desktop scanning electron microscope energy dispersive spectrometer

Desktop scanning electron microscope quotationProduct Parameters

Optical microscope: Magnify 27-160 times

Electron microscope: 350000 times

Detector: High sensitivity four segment backscattered electron detector

Filament material: 1500 hour CeB6 filament

Resolution: better than 6 nm

Placement environment: Adopting professional seismic design, it can be placed in ordinary laboratories, offices, and factories

Acceleration voltage: 4.8kV-20.5kV continuously adjustable

Vacuum extraction time: less than 15 seconds

Detection element range: Elements B (5) - Cf (98)

Spectrum detector: Silicon Drift Detector (SDD)

Cooling method: Non liquid nitrogen Peltier effect electric refrigeration

The Phenom ProX electron microscopy spectrometer can be equipped with all sample cup options and all expansion function software options.

Phenom Scientific Instrument (Shanghai) Co., Ltd. is responsible for promoting and selling the Feina desktop scanning electron microscope in the Chinese market, providing professional and testing services. Feina China has a professional service team that provides optimized solutions; Feina China has proposed the concept of Phenom University, which provides advanced training for users from basic theory of scanning electron microscopy to Level 5 application engineers. Testing centers and after-sales service centers have been established in Shanghai, Beijing, and Guangzhou. Currently, Feina has over 1000 users in China.