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Funa Scientific Instruments (Shanghai) Co., Ltd

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    info@phenom-china.com

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    18516656178

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    Room T5705, Shanghai Hongqiao Libao Plaza, No. 88 Shenbin Road, Hongqiao Town, Minhang District, Shanghai

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Feina Desktop Scanning Electron Microscope - Automated Quality Control Solution

NegotiableUpdate on 12/28
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Overview
Phenom XL G3 Feina Desktop Scanning Electron Microscope - Automated Quality Control Solution is Thermo Scientific's flagship desktop scanning electron microscope platform, built on nearly 80 years of electron microscope technology accumulation from Philips FEI Thermo Fisher. It is stable, reliable, easy to deploy, and highly automated, designed specifically for production quality control, high-throughput testing, and research and development scenarios.
Product Details

Feina Desktop Scanning Electron Microscope - Automated Quality Control Solution

Automated desktop scanning electron microscope designed for quality control and research and development

Phenom XL G3Feina Desktop Scanning Electron Microscope - Automated Quality Control SolutionIt is the flagship desktop scanning electron microscope platform under Thermo Scientific, built on nearly 80 years of electron microscope technology accumulation from Philips FEI Thermo Fisher Scientific. It is stable, reliable, easy to deploy, and highly automated, specifically designed forProduction quality control, high-throughput testing, and research and development scenariosAnd design.

  • Large warehouse design, capable of accommodating 36 samples

  • Complete sample installation to drawing in 1 minute

  • Automation, AI analysis, and energy spectrum integration

  • 3000h CeB6 filament, replaced every 5 years on average

Suitable for various industries such as metals, electronic ceramics, semiconductors, powders, filter membranes, battery materials, etc.

飞纳台式扫描电镜-自动化质控解决方案

⭐ Core Advantage (Strong Conversion Module)

01 | 80 years of electron microscopy technology inheritance, with over 5000 installed units in the entire (quan) sphere

From Philips Electron Microscopy Department to FEI, and then to Thermo Scientific, the Phenom series represents the leading standards in electron microscopy design and manufacturing.

  • In 1939Le Poole proposed the concept of electron microscopy

  • In 1944150kV electron microscope is introduced

  • In 1972The first Philips SEM

  • In 2006The first desktop SEM - Phenom was born

  • so far: Form a multi line product matrix of desktop CeB6/desktop field emission/industry-specific electron microscopy

飞纳台式扫描电镜-自动化质控解决方案

02 | No need to renovate laboratory: use as you go, worry free and save money

  • Built in shock absorption system

  • Low environmental requirements, no need for darkroom or water cooling

  • Suitable for production workshops, QC laboratories, and high-rise office areas

  • Even supports in car and field use

I have participated in geological exploration missions such as Iceland's volcanic crater and Spain's uninhabited island, verifying their environmental reliability.


飞纳台式扫描电镜-自动化质控解决方案

飞纳台式扫描电镜-自动化质控解决方案

03 | CeB6 filament: 3000 hour lifespan, replaced every 5 years

  • High brightness cerium hexaboride (CeB6) filament

  • Replace once every 5 years on average, operate continuously 24/7 without pressure

  • Extremely low maintenance cost, suitable for production lines and long-term experimental use

Compared to ordinary metal filaments, which have a lifespan of 50-200 hours, the cost-effectiveness advantage is obvious.


飞纳台式扫描电镜-自动化质控解决方案

04 | Low voltage imaging: Clear without gold spraying

Phenom XL G3 adopts a new vacuum structure and upgraded backscatter detector (BSD):

  • Higher signal-to-noise ratio at low voltage (2-5 kV)

  • No need to spray gold on non-conductive and sensitive samples

  • Improved imaging efficiency in automated processesAbout 30%

Applicable samples:Fiber, paper, coating, polymer, electronic ceramic CMOS、 Solar cells, etc.

飞纳台式扫描电镜-自动化质控解决方案

Pyramid structure of solar cells

Magnification factor: 10000X

2kV, Unpainted gold, secondary electron image

You can clearly see the pyramid structure and details

飞纳台式扫描电镜-自动化质控解决方案

electronic ceramics

Magnification factor: 1000X

5kV, Backscattered electron image

It is possible to observe the grain size and voids within the ceramic

飞纳台式扫描电镜-自动化质控解决方案

CMOS detector

Magnification factor: 5000X

2kV, Secondary electron image

Clear visibility of pixel units and their surface pollutants

飞纳台式扫描电镜-自动化质控解决方案

Fiber without gold spray under scanning electron microscope (top image), paper without gold spray (bottom image)

05 | Industry 4.0 Automation Platform: Supports AI&Python scripting

1 minute from sample loading to image output

Improved detection flux compared to traditional electron microscopy5-10 times.

Automated analysis software

  • ParticleMetric: Particle Statistics

  • FiberMetric: Fiber Size Analysis

  • Batch output standard reports to achieve true quantitative quality control

    飞纳台式扫描电镜-自动化质控解决方案

    From "seeing" to "calculating": professional automated analysis software, specialized software such as ParticleMetric and Fiber Metric. Automated completion of statistical tasks such as particle size, morphology, and size distribution that require several hours of manual labor, outputting standardized reports, and achieving true quantitative quality control.


Open Programming Interface (PPI)

  • Support Python scripting

  • Can be integrated with production lines and LIMS systems

  • Support unmanned batch detection at night

  • 飞纳台式扫描电镜-自动化质控解决方案

    Deep integration, on-demand ": Open automation interface, providing Python script control (PPI), can be seamlessly integrated into customers' existing automation production lines and LIMS systems. A precise automated motor table, combined with software scripts, can accommodate 36 samples at a time, creating an "unmanned quality inspection factory". Customized programs can automatically take photos and analyze large quantities of samples at night or during rest time, improving equipment utilization.

Large sample panoramic puzzle (MAPS)


View the whole picture with one image, analyze multiple points without omission

Automatically obtain panoramic high-definition images on large samples such as wafers, filter membranes, and metal fracture surfaces, and perform high magnification analysis on preset key points to ensure comprehensive detection.

飞纳台式扫描电镜-自动化质控解决方案

06 | Integrated Spectral Design: A Software for Imaging and Elemental Analysis

No need to switch software, no data loss, easy training, and unified after-sales service.

ChemiSEM real-time color imaging

  • Synchronous acquisition of imaging and energy spectrum

  • Real time color element distribution display

  • Suitable for materials such as metals, ceramics, batteries, coatings, semiconductors, etc

    ChemiSEM Color Imaging Technology

ChemiPhase Phase Phase Analysis

  • Automatic identification of physical phases

  • Output phase composition and area fraction

  • Especially friendly to complex materials such as battery cathodes, ceramics, metallurgy

    飞纳台式扫描电镜-自动化质控解决方案飞纳台式扫描电镜-自动化质控解决方案

    ChemiPhase phase phase analysis software

Phase Mapping Phase Distribution Diagram

  • Based on pixel level quantitative element analysis

  • Automatically identify multiple material phases

    飞纳台式扫描电镜-自动化质控解决方案

    Phenom MAPS large-area image stitching

飞纳台式扫描电镜-自动化质控解决方案

Specifications

Imaging mode

  • Optical microscope: 3-16 ×

  • Electron microscope: 200000 ×

lighting system

  • CeB6 tube filament

  • Acceleration voltage: 2/5/10/15/20 kV (continuously adjustable)

  • Vacuum: low medium high mode

performance

  • Resolution: better than 8 nm

  • Vacuum extraction time: 30 seconds

Carrier platform

  • Large warehouse room, capable of supporting large-sized samples

  • Can accommodate up to 36 samples for automatic testing


Applicable Industries

  • Metal material analysis/metallurgical quality inspection

  • Battery and Material Research and Development

  • Electronic ceramics/semiconductors/components

  • Powder material screening

  • Filter membrane particle and fiber statistics

  • Surface research, coating analysis

  • Universities and research institutions


Why choose Phenom XL G3?

  • International brand technology inheritance (Philips → FEI → Thermo Fisher)

  • A true Industry 4.0 level automated desktop electron microscope

  • Support AI, Python, and unmanned detection

  • Complete spectrum and imaging integrated solution

  • Large sample, high flux quality control

  • On average, replacing the filament every 5 years results in extremely low operating costs