Welcome Customer !

Membership

Help

Daimei Instrument Technology Service (Shanghai) Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products

Daimei Instrument Technology Service (Shanghai) Co., Ltd

  • E-mail

    marketing@dymek.com

  • Phone

    13917837832

  • Address

    Room 306-308, Building 6, No. 35, Lane 2216, Jingao Road, Pudong, Shanghai

Contact Now

FR-Scanner-AIO-Mic-XY300

NegotiableUpdate on 12/23
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin
Overview
FR-Scanner-AIO-Mic-XY300 is an integrated automatic thin film thickness measurement system used for measuring the thickness of single-layer and multi-layer coatings on fully automated patterned wafers. The electric X-Y stage provides a stroke size of 300mm x 300mm, which can be accurately measured when vacuum fixed on the stage. Various optical configurations can be provided within the spectral range of 200-1700nm according to the application requirements of measuring thickness and wavelength range
Product Details

Product Introduction:

The FR-Scanner-AlInOne-Mic-XY300 modular thickness measurement system integrates optical, electronic, and mechanical modules, which can be used for accurate measurement of both non patterned and patterned thin films (such as micro patterned surfaces, rough surfaces).

Place the wafer on a vacuum suction cup (wafer size diameter ≤ 300mm) and equip it with reflectivity standard components. Measurements are performed by powerful optical modules, with spot sizes as small as a few micrometers. The electric platform provides a stroke of 300 millimeters in the XY direction, with excellent performance in speed, accuracy, and repeatability

FR-Scanner-AIO-Mic-XY300Provided:

Real time reflectance spectroscopy measurement

O Film thickness, optical properties, non-uniformity measurement, thickness mapping

O Use an integrated, USB connected high-quality color camera for imaging

Extensive statistical data on measurement parameters

The semi-automatic pattern alignment function is used to measure periodic graphic areas

odifferentSoftware features, such as Click2Move (screen click to locate measurement points), scale bar


Attachment:

  • FR AutoFocus: 100mm long linear axis for autofocus, with two operating modes: image focus (contrast)/reflection intensity

  • Rotation Module: The electric platform of the rotation module provides high resolution and accuracy

  • FR Filter Wheel: The electric filter wheel module has a slot that can accommodate 12 filters and is automatically controlled by a computer. Filter size: 0.5 inches in diameter, with a maximum of 6 filters (1 inch)

  • FR AutoTurret: The automatic turret is computer-controlled and can accommodate 4 objective lenses. The lens switching speed is approximately 1.0-3.0 seconds

  • Lens: Long working distance VIS/NIR lens: 5X, 10X, 20X, 40X, 50X

  • Reflective UV/NIR lenses: 10X, 15X, 25X, 40X

  • Pump: Low noise vacuum pump, 2.5L/min, vacuum degree -60kPa

  • Chucks: 6-inch photomask chuck with reference wafer area, multi wafer chuck (100-300mm and irregular shaped wafers), including reference area and dark area, used for automatic reference


Specifications:

屏幕截图 2024-03-25 104700.png


2D thickness chart:

FR-Scanner XY-300_1.jpg

3D thickness map:

FR-Scanner XY-300_2.jpg


Measurement principle:屏幕截图 2024-03-25 105726.png