09,11,2026 7 views
On November 1-2, 2023, the Advanced Technology and Application Conference for Compound Semiconductors will grandly open in Taicang. As a company dedicated to the research and development of various seriesatomic force microscopeFeishiman, a high-tech enterprise specializing in providing semiconductor industry chip and material nano characterization detection technology solutions, was fortunate enough to participate in the entire conference and exhibit.
Participating in this semiconductor conference is of great significance to us. It provides us with an opportunity to exchange experiences, learn new technology trends, and explore the development trends and prospects of the semiconductor industry with industry experts, scholars, and entrepreneurs.
At the conference, our attending representatives shared their company's outlook and plans for next year during a live interview with the organizers, stating thatIn line with the trend of online production in the semiconductor industry,Based on existing products, Feishi ManWe are currently developing a fully automatic atomic force microscope and expect to release a prototype around the end of next yearTo fill the gap in the domestic industry,And finally conveyed his blessings for this conference.
The conference was a great success, with high levels of participation and activity from attendees. Feishi Man's booth was located in C04, and there was a continuous stream of people coming to exchange and consult. The attending representatives showcased our main products to everyone——Industrial atomic forceMicroscope, with almost unlimited sample size and weight, is particularly suitable for 3D morphology and defect detection of 4, 6, 8, and 12 inch wafer samples. The sample stage has strong expandability, making it very easy to achieve in-situ detection with multiple instruments. This industrial atomic force microscope can meet the needs of different application scenarios and provide customers with a cost-effective solution.
Large scale industrial atomic force microscope that was first commercialized domestically in China
The sample size and weight are almost unlimited, making it particularly suitable for wafers, ultra large gratings, and other applicationsoptical glassWaiting for large sample testing
The sample stage has strong scalability and is very convenient for multi instrument combination to achieve in-situ detection
One click automatic scanning, programmable multiple testing points for fast and automated detection
When scanning the image, the sample remains stationary and the probe is driven to perform XYZ three-dimensional movement measurement imaging
Longmen style scanning head design, marble base, vacuum adsorption stage
Integrated mechanical vibration damping and environmental noise shielding solution, greatly reducing system noise levels
Intelligent and fast needle insertion method for automatic detection of pressurized ceramics by motor control, protecting probes and samples
Scanner non-linear correction user editor, nano characterization and measurement accuracy better than 98%
Through this conference, Feishi Man has established good communication and connections with industry insiders and potential customers, once again laying a solid foundation for the company's future development. Every breakthrough and innovation of Feishi Man cannot be separated from the trust and support of new and old customers. We will continue to firmly establish a development concept that is core enough to support the high-quality progress of the atomic force microscope industry,Always adhering to the corporate spirit of continuous innovation and breakthrough, constantly making progress, delving deeper into advanced technology, refining product structure, and making powerful contributions to promoting the development of the semiconductor industry.
The successful conclusion of this conference is also a new beginning. Feishi Man is grateful to everyone and wishes us to work together, forge ahead, and create brilliance together.
Suzhou Feishiman Precision Instrument Co., Ltd. is a high-tech enterprise in the atomic force microscope industry that integrates research and development, manufacturing, sales, and service consulting. The company focuses on researching and developing various series of atomic force microscopes, providing professional solutions for semiconductor industry chip and material nano characterization detection technology, and continuously providing excellent technology, products, and services to global users.
The atomic force microscope produced by our company can detect the morphology of semiconductor devices with short cycles and high efficiency without damaging the semiconductor samples. AFM surface morphology detection technology, with its simple sample preparation and accurate and efficient measurement results, is an essential detection method in the semiconductor industry.
The core technology team of Feishi Man has long been dedicated to the field of atomic force microscopy, with strong technical and talent accumulation experience, technological innovation, quality and service guarantee system, laying a solid foundation for the company's development. As of 2023, they have obtained more than 60 intellectual property rights such as utility model technology and software copyright in this field, and have obtained multiple certifications such as CE, ISO9001, SGS, etc. Many of their developed products have been rated as high-tech products. Technological development is the inexhaustible driving force for the continuous development of Feishiman. Feishiman has invested a large amount of funds in research and development, striving to seize the initiative and win the initiative in fierce competition, and always maintaining strong vitality in the wave of constantly upgrading new technologies and products.
