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Guangdong Sende Instrument Co., Ltd
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Guangdong Sende Instrument Co., Ltd

  • E-mail

    sende_services@outlook.com

  • Phone

    17688459448

  • Address

    No. 983 Huangpu Avenue East, Huangpu District, Guangzhou City, Guangdong Province

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scanning electron microscope

NegotiableUpdate on 02/07
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Overview
The Zeiss EVO series is a modular scanning platform with intuitive operation, suitable for daily inspection and research applications. The EVO series combined with high-performance scanning electron microscopes brings an intuitive and easy to operate user experience for microscope experts and new users.
Product Details

Zeiss EVO series

Intuitive modular operationscanning electron microscopePlatform, suitable for daily testing and research applications

EVO series combined with high performancescanning electron microscopeTo provide an intuitive and easy-to-use user experience for microscope experts and new users. With a wide range of options, EVO can be customized according to your needs, whether in life sciences, materials science, or daily industrial quality assurance and failure analysis.

lMulti functional solutions for microscope centers or industrial quality assurance laboratories

lObtain excellent images of real samples

lHigh image quality achieved using lanthanum hexaboride (LaB6) emitter

lConduct tests on non-conductive and uncoated samplesExcellent imaging and analysis

lWorkflow automation and data integrity

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Intelligent navigation and imaging

Improve your sample processing throughput, enhance work efficiency and performance

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Zeiss Navigation Camera

The camera can be installed in the sample chamber to monitor the relative position between the sample and the backscattered detector pole shoe(Sample warehouse camera);Or installed on the door of the vacuum sample chamber(navigation camera)Provide an overview of the arrangement of samples or components on the sample carrier. This view can be used to preset the regions of interest identified by optical microscope images and enable easy navigation throughout the entire sample detection process.

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Automated intelligent imaging

EVO can automatically complete automated image acquisition of cross batch samples without human supervision. Zeiss automated intelligent imaging is very suitable for daily detection applications. Users can define boundary areas, automatically generate regions of interest determined by the desired observation field or magnification, and start automatic image acquisition, thereby improving your sample processing throughput, work efficiency, and performance.


Entering a new era of detection applications

Obtaining richer data using LaB6 electron gun

Compared to traditional needle type tungsten filaments, the electron emission of lanthanum hexaboride cathodes can be customized to ensure that every detail of the image is displayed according to your needs. You will benefit from the following two aspects:

lWith the same size (such as resolution) of the electron probe, you can achieve higher probe current, making image navigation and optimization easier.

lIn the case where the probe beam current (signal-to-noise ratio) remains constant, the beam diameter is much smaller, which can improve image resolution.


EVO can be well interconnected with other microscopes

Benefit from workflow automation and associated microscopy technology

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application

Manufacturing and assembly industry

lquality analysis/quality control

lFailure Analysis/金相研究

lCleanliness inspection

ltalismanParticle morphology analysis in accordance with ISO 16232 and VDA 19 Part 1-2 standardsAnd chemical analysis

lAnalysis of non-metallic inclusions

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Semiconductors and Electronicscomponent

lElectronic components, integrated electronicsRoads, MEMS devices, andVisual inspection of solar cells

lCopper wire surface and crystal structure detection

lMetal corrosion detection

lSection Failure Analysis

lWelding foot detection

lSurface imaging of capacitors

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Steel and other metals

lImaging and analysis of the structure, chemical properties, and crystal structure of metal samples and inclusions

lPhase, particle size, welding, and failure analysis

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raw materials

lMorphological, mineralogical, and compositional analysis of geological samples

lImaging and analysis of metal structures, fractures, and non-metallic inclusions

lAnalysis of morphology and composition of raw materials, chemicals, and active ingredients during micronization and granulation processes

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Materials Science Research

lCharacterization of conductive and non-conductive material samples in research applications

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Life Sciences

lResearch on plants, animals, and microorganisms

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forensic medicine

lGunshot residueGoods (GSR)

lAnalysis of Coatings and Glass

lCoin forgery

lComparison of hair and fiber

lForensic toxicology

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