The main features of the second-hand JEOL field emission electron microscope SEM+EDX+EBSD are: the electrical system using submerged Schottky electron gun technology; A TTLS system (Through The Lens System) that utilizes GB (Gentle Beam mode) and various detectors to observe and select signals with high resolution at low acceleration voltages; Hybrid objective lens with electric superposition.
Product Details
Used JEOL field emission electron microscope SEM+EDX+EBSDTechnical specifications
JSM-7200F JSM-7200FLV
resolution
1.0 nm(20kV)，1.6 nm(1kV)
1.0 nm(20kV)，1.6 nm(1kV)，1.8nm (30kV, LV )
magnification
×10～×1,000,000(120mm x 90mm photograph size); ×30～×3,000,000(1280 x 960pixels display);
accelerating voltage
0.01kV～30kV
Beam current
1pA～300nA
Automatic aperture angle control lens ACL
built-in
Large depth of field mode
built-in
detector
High level detector (UED), low level detector (LED)
Used JEOL field emission electron microscope SEM+EDX+EBSDJEOL JSM-7200F is a high-performance thermal field emission scanning electron microscope (FE-SEM) with high resolution and low voltage observation capabilities, widely used in cutting-edge research and industrial quality inspection in materials science, semiconductor, nanotechnology, and other fields.
1、 Core Technologies and Advantages
Immersion Schottky thermal field emission electron gun
Derived from the flagship model JSM-7800F Prime, it provides high brightness and high stability electronic sources.
The probe current can reach 300 nA, meeting the requirements of high-resolution imaging and energy dispersive spectroscopy (EDS) elemental analysis.
Hybrid objective lens (electromagnetic field superposition type)
Combining magnetic and electrostatic lenses results in smaller spherical aberration and significantly improved resolution.
Retaining the large working distance and ease of use of traditional out lens designs, allowing for direct observation of magnetic materials.
TTLS intravitreal signal system+GB soft beam mode
TTLS (Through The Lens System): Efficiently collects weak signals under low voltage through in mirror detectors.
GB (Gentle Beam) mode: Apply bias voltage to the sample to achieve low acceleration voltage and high-resolution imaging, effectively reducing sample charging and damage.
Support simultaneous separation and acquisition of secondary electron (SE) and backscattered electron (BSE) signals.
2、 Key technical parameters
Electron Gun: Schottky Thermal Field Emission (Immersion)
