Welcome Customer !

Membership

Help

Saifei Scientific Instruments (Suzhou) Co., Ltd
Custom manufacturer

Main Products:

instrumentb2b>Products

Saifei Scientific Instruments (Suzhou) Co., Ltd

  • E-mail

    michael.han@sypht.com.cn

  • Phone

  • Address

    Wujiang District Science and Technology Innovation Park, Suzhou City, Jiangsu Province

Contact Now

Tungsten filament scanning electron microscope

NegotiableUpdate on 01/30
Model
Nature of the Manufacturer
Producers
Product Category
Place of Origin
Overview
JSM-IT200 InTouchScope amp; trade; Tungsten filament scanning electron microscope is a simpler, easier to use, and cost-effective scanning electron microscope.
Product Details

JSM-IT200 InTouchScope™Tungsten filament scanning electron microscopeIt is a more concise, user-friendly, and cost-effective scanning electron microscope.

Using a beginner friendly sample exchange navigation, it is easy to search for the field of view from the sample stage and start observing SEM images. Zeromag can search the field of view intuitively like a light mirror, Live Analysis * ² can obtain real-time elemental analysis results without special analysis, and SMILE VIEWTM Lab can comprehensively edit observation and analysis reports, making it a software for analyzing business.

Observe immediately! Analyze immediately! Report immediately!

JEOL InTouchScope ™ The three functions of the series make the analysis device a tool.

■ JSM-IT200 InTouchScope™Tungsten filament scanning electron microscopeObserve the start of sample exchange navigation while completing the sample exchange

Sample exchange navigation is the function of navigating from opening the sample chamber to starting the observation process;


1617_it200_01-1.jpg

Observe immediately! Zeromag observation

Use the schematic diagram of the sample stage displayed in the main window and the optical CCD image * ¹ to search for the field of view and analyze the position.

1617_it200_02-1.jpg

Analyze immediately! Live Analysis Analysis * ²

By displaying spectra and elements, it is possible to confirm the spectra and main elements of the field of view being observed.


1617_it200_03-1.jpg

Report immediately! SMILE VIEWTM Lab Centralized Data Management

After pressing the data management icon and displaying the data management window, from SEM images to analysis, batch reports can be created, data can be viewed, and data can be reanalyzed for all data.

1617_it200_04.jpg