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michael.han@sypht.com.cn
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Wujiang District Science and Technology Innovation Park, Suzhou City, Jiangsu Province
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Saifei Scientific Instruments (Suzhou) Co., Ltd
SEM scanning electron microscope
NegotiableUpdate on 01/30
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Overview
Scanning electron microscopy is not only an essential tool for scientific research, but also for manufacturing factories that require quality control. In these scenarios, users need to repeat the same observation operations, so quickly completing these operations can help improve work efficiency. The "Simple SEM" function added to JSM-IT510 allows users to manually repeat the operations required for scanning electron microscopy observation, making it more efficient and easy to complete scanning electron microscopy observations.
Product Details
NEW Simple SEM
SEM scanning electron microscopeJust select the target field of view
Simple SEM supports daily work
Sample: Electronic Components
Acceleration voltage: 15 kV, amplification factor: × 50 (upper) × 1000 (lower), signal: BE
JSM-IT510 InTouchScope™SEM scanning electron microscopeSample exchange navigation
From sample exchange guidance to automatic observation, it is safe and simple!
1. Set the sample according to the navigation guide
Measure the height of the sample
2. Prepare to evacuate and observe
*The sample table navigation system (SNS) is an optional accessory
*The navigation system (SNSLS) for the two major regional sample stations is an optional accessory
*3 Sample Room Camera (CS) is an optional accessory
3. Automatically start observation
Automatic imaging after vacuum completion
Water image 1.jpg Zeromag
JSM-IT510 InTouchScope ™ Scanning electron microscopy enables seamless conversion between optical images and SEM images with ease
The Zeromag feature simplifies navigation and provides a seamless transition from optical images to SEM images.
SEM、 The optical image and sample stage schematic are all linked together to obtain a global view of the analysis location.
Sample: Ammonite Fossil Acceleration Voltage: 7kV Signal: BE
Water image 1. jpg real-time analysis/real-time guidance image * 2
1. While observing SEM, grasp the elemental composition of the area
Real time analysis is a feature that displays EDS spectra or elemental maps in real-time during image observation. This feature supports searching for target elements and provides alerts.
2. Simple analysis
Click up to 3 times to start EDS analysis
Water image 1.jpg with multiple advanced options
1. NEW Low Vacuum Hybrid Secondary Electron Detector (LHSED)*
This new detector can collect electronic and photon signals and provide images with high signal-to-noise ratio and enhanced morphology information
2. NEW real-time 3D*
The images obtained by the new multi-directional segmentation BE detector * can be displayed as real-time 3D images.
Even if the sample has subtle surface undulations, real-time 3D can intuitively represent them clearly and obtain their depth information.
Sample: Screw Acceleration Voltage: 15kV Amplification Factor: x100 Signal: BE
3. Montage
The montage function can automatically capture images from multiple small fields of view and stitch them together into a larger field of view image.
Sample: ammonite fossil
Acceleration voltage: 15kV Amplification factor: x150 Signal: BE Field of view: 13 x 13.
4. Display signal depth
This function displays the real-time analysis depth (approximate value) of the tested sample, which is very useful for elemental analysis.
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