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Saifei Scientific Instruments (Suzhou) Co., Ltd
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Saifei Scientific Instruments (Suzhou) Co., Ltd

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    michael.han@sypht.com.cn

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    Wujiang District Science and Technology Innovation Park, Suzhou City, Jiangsu Province

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Japanese electron microscope

NegotiableUpdate on 01/30
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Overview
JSM-IT510 InTouchScope amp; trade; Japanese electron microscopes are not only essential tools for scientific research, but also for manufacturing factories that require quality control. In these scenarios, users need to repeat the same observation operations, so quickly completing these operations can help improve work efficiency. The "Simple SEM" function added to JSM-IT510 allows users to "manually repeat operations" required for SEM observation, making SEM observation more efficient and easy.
Product Details

Water NEW Simple SEM

Simply select the target field of view "Simple SEM" to support daily work.

Sample: Electronic Components

Acceleration voltage: 15 kV, amplification factor: × 50 (upper) × 1000 (lower), signal: BE

简单SEM_01-1.jpg


JSM-IT510 InTouchScope™Japanese electron microscopeSample exchange navigation

From sample exchange guidance to automatic observation, it is safe and simple!

1. Set the sample according to the navigation guide


样品交换导航.jpg


Measure the height of the sample

2. Prepare to evacuate and observe


准备抽真空观察-1.jpg

*The sample table navigation system (SNS) is an optional accessory

*The navigation system (SNSLS) for the two major regional sample stations is an optional accessory

*3 Sample Room Camera (CS) is an optional accessory

3. Automatically start observation

Automatic imaging after vacuum completion

自动开始观察.jpg

ZeromagJSM-IT510 InTouchScope™Japanese electron microscopeEasily achieve seamless conversion between optical images and SEM images

The Zeromag feature simplifies navigation and provides a seamless transition from optical images to SEM images.

SEM、 The optical image and sample stage schematic are all linked together to obtain a global view of the analysis location.


Zeromag.jpg

Sample: Ammonite Fossil Acceleration Voltage: 7kV Signal: BE

Real time analysis/real-time guidance chart * 2

1. While observing SEM, grasp the elemental composition of the area

Real time analysis is a feature that displays EDS spectra or elemental maps in real-time during image observation. This feature supports searching for target elements and provides alerts.


实时分析引导图.jpg

2. Simple analysis: Click up to 3 times to start EDS analysis

简单分析.jpg

Multiple advanced options

1. NEW Low Vacuum Hybrid Secondary Electron Detector (LHSED)*

This new detector can collect electronic and photon signals and provide images with high signal-to-noise ratio and enhanced morphology information


LHSED.jpg

The images obtained by the NEW real-time 3D multi-directional segmentation BE detector can be displayed as real-time 3D images.

Even if the sample has subtle surface undulations, real-time 3D can intuitively represent them clearly and obtain their depth information.


实时3D.jpg

Sample: Screw Acceleration Voltage: 15kV Amplification Factor: x100 Signal: BE

3. Montage

The montage function can automatically capture images from multiple small fields of view and stitch them together into a larger field of view image.

蒙太奇.jpg

Sample: ammonite fossil

Acceleration voltage: 15kV Amplification factor: x150 Signal: BE Field of view: 13 x 13

4. Display signal depth

This function displays the real-time analysis depth (approximate value) of the tested sample, which is very useful for elemental analysis.


显示信号深度.jpg