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Saifei Scientific Instruments (Suzhou) Co., Ltd
Thermal field emission scanning electron microscope
NegotiableUpdate on 01/30
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Overview
The clear visibility of JSM-IT710HR thermal field emission scanning electron microscope promotes new discoveries! Currently, in addition to nanoscale resolution and analytical performance, the processing capability of data acquisition is also considered important. JSM-IT710HR is the fourth generation product of JEOL's HR * series, launched with the concept of "SEM that allows anyone to easily capture high-resolution images". The automation and improved observation performance of JSM-IT710HR operations can enable users to explore the unknown from what they can see.
Product Details
///Beyond what is seen, explore the unknown///
JSM-IT710HR reduces charge: Sample provided by Mr. Tetsuro Asakura, Life Engineering Department, Faculty of Engineering, Tokyo A&M University
Crystal Structure Analysis of JSM-IT710HR: Sample Provided by Mr. Akira Tsurumi from the Institute of Materials Science (NIMS)
New features
1. Automatic observation: Simple SEM/EDS
Simple SEM achieves automatic testing by setting multiple conditions at once, improving daily work efficiency.
2. Live 3D: Real time 3D
3D live images can be observed at low magnification.
3. JSM-IT710HRThermal field emission scanning electron microscopeLow Vacuum Hybrid Secondary Electron Detector (LHSED)
LHSED is a novel low vacuum detector that can switch between observing light emission information and morphology images.
4. The stability of Schottky field emission electron gun has been improved by more than 4 times
>Automatic electron beam adjustment
The JSM-IT7010HR can automatically adjust from axis alignment to astigmatism and focus, without the need for tedious manual labor.
>Secondary electronic detection system
Left sample: Peacock feathers, right sample: Cellulose microfibers
>High resolution and large beam current
The integrated Schottky field emission electron gun and spotlight of JSM-IT710HR can generate a large beam while maintaining a small beam spot, enabling high-resolution observation and analysis.
>Backscattered electron detection system
The new multi segmentation backscatter detector can simultaneously collect backscatter information from four directions, generate simple 3D images, and display them in real-time.
5. All analyses start from Zeromag
By using Zeromag's optical image, the field of view search ability is improved; The linkage between SEM images and optical images simplifies observation, analysis, and automatic testing.
6. JSM-IT710HRThermal field emission scanning electron microscopeEDS integrated system
In addition to SEM, JEOL also independently produces and sells EDS. By utilizing this advantage, SEM observation images and EDS analysis results can be centrally operated and managed, improving operability and data management capabilities.
7. Thermal field emission scanning electron microscopephase analysis
JEOL's EDS has added phase analysis capabilities, allowing for surface distribution analysis of each substance (compound/monomer).
Sample: Cross section of precision cutting blade
Phase analysis shows that there are differences in the composition of Co, Cu, and Sn rich regions.
Co area: 68.15%
CuSn (CuRich) area: 16.25%
CuSn (SnRich) area: 14.54%
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