Theoretical wavelength dispersive X-ray fluorescence spectrometer

For over 40 years, the Rigaku Simultax synchronized wavelength dispersive X-ray fluorescence (WDXRF) spectrometer system has been widely used as an elemental analysis tool for process control in industries that require high throughput and accuracy, such as steel and cement. Nearly 1000 Simultax wavelength dispersive X-ray fluorescence spectrometers have been delivered to customers worldwide. With the advancement of technology in recent years, customer requirements have become increasingly diverse.Theoretical wavelength dispersive X-ray fluorescence spectrometerSimultix 1Developed specifically to meet these constantly changing needs. It provides significantly improved performance, functionality, and usability. The compact and intelligent Simultax 15 is a powerful elemental analysis tool that demonstrates performance in many industrial fields.

Wavelength dispersive X-ray fluorescence spectrometer is an instrument used for analyzing the composition of substances. It uses characteristic fluorescent radiation generated by the interaction between X-rays and matter for analysis. The following are the introduction points of the spectrometer:

1. Basic principle: By dispersing incident X-rays into different wavelengths through crystal diffraction, and then using a detector to measure the fluorescence radiation intensity of these different wavelengths. Each element has its specific fluorescence radiation wavelength, and by measuring these wavelengths, the presence and relative content of different elements in the sample can be determined.

2. Instrument composition: A typical wavelength dispersive X-ray fluorescence spectrometer includes an X-ray source, sample holder, crystal diffractometer, detector, and data processing system. The X-ray source generates high-energy X-rays, the sample is placed on a support for analysis, the crystal diffractometer is used to disperse the incident X-rays, and the detector is used to measure the fluorescence radiation intensity and transmit the data to the data processing system for analysis and interpretation.

3. Analysis application:Theoretical wavelength dispersive X-ray fluorescence spectrometerSimultix 15Widely used in fields such as materials science, geology, environmental monitoring, and metal analysis. It can quickly and non destructively determine the elemental composition in the sample, with high sensitivity and a wide measurement range.

4. Advantages and limitations: It has the advantages of high resolution, accuracy, and reproducibility. However, it may be limited by background interference in detecting low concentration elements, and its analytical ability for very light elements such as hydrogen and lithium is relatively weak.

In summary, wavelength dispersive X-ray fluorescence spectrometer is an important analytical tool that can be used to quickly and accurately determine the elemental composition of substances, and plays a role in many scientific and industrial fields.

XRF is used for fast and accurate elemental analysis

Analyze beryllium (Be) to uranium (U) in almost any sample matrix. The most important indicators of automated process control are precision, accuracy, and sample throughput. With up to 30 (and optional 40) discrete and optimized element channels and 4kW (or optional 3kW) X-ray tube power, it provides analysis speed and sensitivity. Combining powerful yet easy-to-use software with extensive data simplification and maintenance functions, this instrument is an elemental analysis and measurement tool.

Automated XRF elemental analysis

For high-throughput applications, automation is a fundamental requirement. Can be equipped with a 48 bit automatic sampler (ASC). For full automation, the optional sample loading unit provides feeding from the right or left conveyor belt of a third-party sample preparation automation system.

Perform elemental analysis by synchronizing WDXRF

feature

Synthesizing multiple layers, RX-SERIES

The intensity generated by the new synthesized multilayer crystal "RX85" is about 30% higher than that of existing Be Ka and B-Ka multilayer crystals.

XRD channel

Simultax 15 is equipped with XRD channels, which can perform quantitative analysis through XRF and XRD.

Hyperbolic crystal

Optional hyperbolic crystals can be equipped with fixed channels. Compared to single curved crystals, hyperbolic crystals have increased strength.

Improved software is easy to use

Simultax 15 software adopts the same quantitative analysis workflow as ZSX software, enhancing the operability of quantitative condition settings.

Heavy and light scanning angle measuring instruments

The optional wide element range goniometer supports semi quantitative (FP) without standard samples and can be used for qualitative or quantitative determination of unconventional elements.

BG measurement of trace elements

Optional background measurement (BG) for fixed channels to improve the accuracy of calibration fitting.

Automatic Pressure Control (APC)

The optional APC system maintains a constant vacuum level in the optical chamber to significantly improve the accuracy of light element analysis.

Quantitative scattering ratio method

When using the Compton scattering ratio method for ore and concentrate analysis, the optional quantitative scattering ratio method generates theoretical alpha for scattering ratio calibration.

Up to 40 fixed channels

The standard 30 fixed channel configuration can be upgraded to 40 channels.

automation

The optional sample loading device provides conveyor belt feeding from a third-party sample preparation automation system.