Spike X-ray Fluorescence Spectrometer XEPOS Technical Parameters

Spike X-ray Fluorescence Spectrometer XEPOS Technical Parameters

The German company Spike Analytical Instruments has developed an extremely successful technology that applies polarized X-rays to fluorescence analysis. Just as polarizing filters are an irreplaceable tool in capturing high-quality images today, this analytical technique has become an irreplaceable means for laboratory measurements of primary, secondary, and trace elements. Spike Analytical Instruments continues to develop this technology and has launched a new generation of instrument - the SPECTRO XEPOS desktop polarized X-ray fluorescence spectrometer.
Spike X-ray Fluorescence Spectrometer XEPOS Technical Parameters

The SPECTRO XEPOS adopts high-performance components internally, which can achieve good sensitivity and accuracy. The use of polarized secondary targets to ensure optimal excitation, 12 position sample automatic exchangers, pre installed application software packages and intelligent software modules make the SPECTRO XEPOS a truly multifunctional elemental analyzer.

The SPECTRO XEPOS comes with pre installed application packages, including various hardware and analysis methods pre calibrated at the factory. Suitable for analysis: RoHS testing of soil, sludge, additives in oil, cement, slag, refractory materials, electronic components, etc.

The XEPOS X-ray fluorescence spectrometer can be widely used for the analysis of lead, cadmium, (mercury) and other elements in various electronic materials and plastics. It has a low detection limit, high sensitivity, and good stability, and can cope with European WEEE and RoHS directives.