SRM 1976c alumina X-ray powder diffraction standard

SRM 1976c alumina X-ray powder diffraction standard Introduction:

NIST item number: SRM 1976c

English name: Instrument Response Standard for X-Ray Powder Diffraction

Chinese name: Alumina X-ray Powder Diffraction Standard

Specification: 1 disc

Validity period:

The certification of SRM 1976c is valid indefinitely within the specified measurement uncertainty range, provided that SRM processes and stores it in accordance with the instructions in this certificate (see "Storage and Use Instructions"). There is no need to periodically re certify this SRM. If the SRM is damaged, contaminated, or otherwise modified, the certification is invalid.

Material Description:

The manufacturing process used to produce this SRM was developed for the production of electronic component substrates. The alumina powder used as a precursor for these substrates has high phase purity (corundum structure) and a sheet-like particle morphology. The diameter of platelets is usually 5 μ m to 10 μ m, and the thickness is 2 μ m to 3 μ m. The compaction process of the disc produces an axisymmetric texture, with its basal plane tending to be parallel to the surface of the disc. The axisymmetric nature of texture allows for the installation of samples in any direction around the surface normal. Use a small amount of calcium feldspar glass to compact the block for liquid-phase sintering. No crystalline impurities were detected. The glass phase involved in liquid-phase sintering effectively prevents contact between particles and relaxes during the cooling of the workpiece from the sintering temperature. This leads to the minimum development of microstrain and its related spectral line broadening; Although some micro strains can be detected, such as Gaussian broadening with tan θ dependence. Considering this, and with minimal grain size broadening, SRM 1976c can be used to obtain an approximate value of the instrument profile function (IPF). However, it is not recommended to use SRM 1976c for quantitative microstructure analysis. The disks that make up the SRM raw materials are manufactured in a specialized production run to ensure consistency in microstructure in terms of particle size, shape, microstrain, and texture.

Product Usage

This standard reference material (SRM) consists of a sintered alumina disk used to calibrate the line position and intensity of X-ray powder diffraction equipment as a function of the 2 θ angle. The solid form of SRM eliminates any changes in strength measurement introduced during the sample loading process. One unit of SRM 1976c consists of sintered alumina discs with a diameter of approximately 25.6mm and a thickness of approximately 2.2mm.

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