SA8000 Semiconductor Parameter Analyzer

SA8000 Semiconductor Parameter AnalyzerIntroduction:

A semiconductor device parameter analyzer is a process testing instrument used to test the electrical performance of semiconductor devices. It supports current-Voltage（IV）Capacitor-Voltage（CV）Pulse/dynamicIVThe characterization of various characteristics is a key equipment for semiconductor research and development, manufacturing, and quality control. This type of instrument usually adopts modular design, and users can flexibly configure functional modules according to testing needs, and are equipped with dedicated software and touch screen interface to simplify the operation process. Its high-precision measurement capability (such asF AnGrade currentµVLevel voltage resolution is suitable for a wide range of characterization needs from basic devices to processes, and has applications in multiple fields such as semiconductors, consumer electronics, and automotive electronics

With independent and controllable architecture innovation, it has opened up the space for large-scale application of domestic equipment. This product is designed based on the PXIe architecture with fully independent intellectual property rights. It supports up to 18 modules working simultaneously and can flexibly combine DC IV, CV, and fast pulse measurement units. Through high-speed bus and unified synchronous trigger management, it achieves precise collaborative testing of multiple modules without the need for repeated switching between multiple instruments, greatly improving testing efficiency and data consistency. Its core measurement capability reaches a current resolution of 0.1fA, which can stably capture ultra weak signals from devices such as memristors and quantum dots; At the same time, it is equipped with a Quick Test mode that does not require programming and supports Python custom device testing algorithms, balancing usability and flexibility. Currently, it has entered the procurement list of domestic universities such as Fudan University and Tsinghua University in the field of two-dimensional materialsNeuromorphic computationThe cutting-edge research fields have achieved practical applications.

Core performance parameters

Current measurement capability: 0.1 fA (10 ⁻¹⁶ A) ultra-high current resolution, which can stably capture ultra weak signals from devices such as memristors and quantum dots

Hardware architecture: Based on PXIe architecture, it supports up to 18 modules working simultaneously, equipped with high-speed bus communication and unified synchronous trigger management, without the need for multiple instruments to switch

Test coverage: Flexible combination of DC IV, CV, and fast pulse measurement units, compatible with various PXIe instruments

Software Capability:

Quick Test mode without programming (classic testing/application testing/sequence testing modes)

Support Python programming to customize device testing algorithms, open for secondary development

Product advantages
Weak current detection
Based on years of technological accumulation in the field of source meters, SA8000 has achieved a current measurement resolution of 0.1 fA (10-16A), which can stably capture ultra weak signals from devices such as memristors and quantum dots, providing reliable weak signal measurement capabilities for cutting-edge exploration.

Comprehensive multidimensional testing capability
The system is based on the PXIe architecture and supports up to 18 modules working simultaneously. It can flexibly combine DC IV, CV, and fast pulse measurement units. Through high-speed bus communication and unified synchronous trigger management, it can adapt to various PXIe instruments. No need to repeatedly switch between multiple instruments, significantly improving testing efficiency and data consistency.

Quick Test mode without programming
Classic testing mode: supports flexible and diverse parameter configurations to meet the needs of various testing scenarios; Application testing mode: Multiple preset device algorithms can be selected to quickly test the characteristic curves or key parameters of the devices; Sequence testing mode: supports automatic sequential execution of test sequences edited by multiple classic tests or application tests;

Custom Device Testing AlgorithmThe device algorithm in the application testing mode is programmed using Python and is open for customers to customize device testing algorithms. Users can customize the testing process and parameter extraction algorithm of the device according to their own research needs, greatly improving testing flexibility and algorithm reproducibility.

The main optional modules are as follows:

Typical Applications

SA8000 is widely used in the research and testing of various semiconductor devices, covering both traditional devices and cutting-edge research fields

Typical cutting-edge applications:

1. Research on Memristor and Neuromorphic Computing: Built in waveform generation and rapid measurement unit with a minimum pulse width of 200ns, capable of real-time recording of impedance changes, providing high fidelity raw data for neuromorphic computing chips.
2. The research on two-dimensional materials and quantum devices benefits from the ultra-low current fraction measurement capability of 0.1fA. SA8000 can accurately characterize the weak conductivity changes of two-dimensional materials (such as graphene and MoS ₂), supporting the study of the working mechanism of new devices such as quantum dots.