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Saifei Scientific Instruments (Suzhou) Co., Ltd
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Saifei Scientific Instruments (Suzhou) Co., Ltd

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    michael.han@sypht.com.cn

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    Wujiang District Science and Technology Innovation Park, Suzhou City, Jiangsu Province

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Japanese scanning electron microscope

NegotiableUpdate on 01/30
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Overview
JSM-IT200 InTouchScope The Japanese scanning electron microscope is a simpler, easier to use, and cost-effective scanning electron microscope.
Product Details

JSM-IT200 InTouchScope™Japanese scanning electron microscopeIt is a more concise, user-friendly, and cost-effective scanning electron microscope.

Using a beginner friendly sample exchange navigation, it is easy to search for the field of view from the sample stage and start observing SEM images. Zeromag can search the field of view intuitively like a light mirror, Live Analysis * ² can obtain real-time elemental analysis results without special analysis, and SMILE VIEWTM Lab can comprehensively edit observation and analysis reports, making it a software for analyzing business.

Observe immediately! Analyze immediately! Report immediately!

JEOL InTouchScope ™ The three functions of the series make the analysis device a tool.

■ JSM-IT200 InTouchScope™Japanese scanning electron microscopeObserve the start of sample exchange navigation while completing the sample exchange

Sample exchange navigation is the function of navigating from opening the sample chamber to starting the observation process

日本电子扫描电镜

Observe immediately! Zeromag observes the schematic diagram of the sample stage displayed in the main window and the optical CCD image * ¹ to search for the field of view and analyze the position.

日本电子扫描电镜

Analyze immediately! Live Analysis analysis * ² can confirm the spectrum and main elements of the field of view being observed by displaying spectra and display elements.

日本电子扫描电镜

Report immediately! After pressing the data management icon and displaying the data management window, SMILE VIEWTM Lab can create batch reports, view data, and reanalyze all data from SEM images to analysis.

日本电子扫描电镜