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Saifei Scientific Instruments (Suzhou) Co., Ltd
Japanese Electronic SEM
NegotiableUpdate on 01/30
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Overview
JSM-IT510 InTouchScope Japanese electronic SEM is not only an essential tool for scientific research, but also for manufacturing factories that require quality control. In these scenarios, users need to repeat the same observation operations, so quickly completing these operations can help improve work efficiency. The "Simple SEM" function added to JSM-IT510 allows users to "manually repeat operations" required for SEM observation, making SEM observation more efficient and easy.
Product Details
Water NEW Japan Electron SEM
Simply select the target field of view "Simple SEM" to support daily work.
Sample: Electronic Components
Acceleration voltage: 15 kV, amplification factor: × 50 (upper) × 1000 (lower), signal: BE
JSM-IT510 InTouchScope™Japanese Electronic SEMSample exchange navigation
From sample exchange guidance to automatic observation, it is safe and simple!
1. Set the sample according to the navigation guide
Measure the height of the sample
2. Prepare to evacuate and observe
*The sample table navigation system (SNS) is an optional accessory
*The navigation system (SNSLS) for the two major regional sample stations is an optional accessory
*3 Sample Room Camera (CS) is an optional accessory
3. Automatically start observation
Automatic imaging after vacuum completion
ZeromagJSM-IT510 InTouchScope™Japanese electron microscopeEasily achieve seamless conversion between optical images and SEM images
The Zeromag feature simplifies navigation and provides a seamless transition from optical images to SEM images.
SEM、 The optical image and sample stage schematic are all linked together to obtain a global view of the analysis location.
Sample: Ammonite Fossil Acceleration Voltage: 7kV Signal: BE
Real time analysis/real-time guidance chart * 2
1. While observing SEM, grasp the elemental composition of the area
Real time analysis is a feature that displays EDS spectra or elemental maps in real-time during image observation. This feature supports searching for target elements and provides alerts.
2. Simple analysis: Click up to 3 times to start EDS analysis
Multiple advanced options
1. NEW Low Vacuum Hybrid Secondary Electron Detector (LHSED)*
This new detector can collect electronic and photon signals and provide images with high signal-to-noise ratio and enhanced morphology information
The images obtained by the NEW real-time 3D multi-directional segmentation BE detector can be displayed as real-time 3D images.
Even if the sample has subtle surface undulations, real-time 3D can intuitively represent them clearly and obtain their depth information.
Sample: Screw Acceleration Voltage: 15kV Amplification Factor: x100 Signal: BE
3. Montage
The montage function can automatically capture images from multiple small fields of view and stitch them together into a larger field of view image.
Sample: ammonite fossil
Acceleration voltage: 15kV Amplification factor: x150 Signal: BE Field of view: 13 x 13
4. Display signal depth
This function displays the real-time analysis depth (approximate value) of the tested sample, which is very useful for elemental analysis.
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