Japan Electronics IT210 Scanning Electron Microscope

Data collection is simple!

JSM-IT210 Scanning Electron MicroscopeIt is the smallest floor standing scanning electron microscope manufactured by Japanese electronics.

5-axis motor drive makes operation more secure and fast; And because it is equipped with "Simple SEM", it can automatically observe and analyze the selected micro areas.

JSM-IT210 is a compact and unmanned next-generation SEM.

Main features

1. Safe and simple sample exchange navigation

① Insert the sample according to the navigation instructions

② Prepare for observation by utilizing the vacuum gap

③ Automatically start observation

2. No need to enlarge the optical image, SEM image linked with "Zeromag"

Zeromag "is a schematic diagram of the sample stage, optical image, and SEM image linkage function. When multiple samples are placed on the sample stage or specific positions are observed, it is easy to find the area to be observed.

3. Real time element analysis during observation using 'Live Analysis'

Live Analysis "is a function that displays real-time feature X-rays and element surface distributions, allowing users to observe and search for target elements at the same time.

4. Colorful automatic testing "Simple SEM" function

Simple SEM "is a function that automatically captures images by simply setting the observation area.

5. Powerful automatic testing support function

High precision sample stage assists in automatic testing. The improvement of the position accuracy of the sample stage makes continuous and automatic testing of multiple points and domains more practical.

6. Standard equipped with 60mm²Large caliber EDS, faster analysis speed

*It can obtain spectra of the same quality as traditional EDS in a short period of time, and also efficiently perform multi-point analysis.

*Thermal sensitive samples can also be tested with peace of mind

Traditional EDS technology requires high current for analysis, which may cause deformation of thermally sensitive samples due to thermal damage, thereby affecting the analysis of element surface distribution.

60 mm²EDS can obtain element surface distribution by reducing the irradiation current, which can reduce thermal damage and perform analysis.

*Even in a short period of time, JSM-IT210 scanning electron microscope can obtain clear elemental surface distribution maps

60mm²EDS can only measure for 1 minute and still obtain a clear enough elemental distribution map.