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Shanghai Mingce Electronic Technology Co., Ltd

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    Yl@monchtec.com

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    18917639396

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    Room 803, Building 1, No. 199 Guangfulin East Road, Songjiang District, Shanghai

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Inframet ST Shortwave Infrared Camera Testing System

NegotiableUpdate on 01/02
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Overview

The ST testing system uses a series of different targets to project standard target graphics onto the tested shortwave infrared camera. The distorted target images generated by the shortwave infrared camera are collected by a computer and the important parameters of the shortwave infrared camera are calculated subjectively by the human eye or software. The ST testing system includes a reflective parallel light tube, a bandwidth light source, a medium temperature blackbody, a rotating target wheel, a set of targets, and a set of filters, PC, Composed of an image acquisition card and testing software.

Product Details

    Summary:
    SWIR camera (short wave infrared) is an important optoelectronic camera for monitoring. Firstly, the development and maturity of InGaAs technology have promoted the development of low-cost shortwave infrared cameras; Secondly, InGaAs cameras are very sensitive on very dark nights, allowing them to generate clearer images; Again, compared to TV/LLLTV cameras, short wave infrared cameras working in visible/near-infrared bands are less prone to damage in unclean air environments; In addition, short wave infrared cameras can generate higher resolution images using small optical systems compared to infrared thermal imagers.


    Inframet ST 短波红外相机测试系统
  • Schematic diagram of ST testing system


  • The principle of shortwave infrared camera is similar to that of TV/LLLTV camera, which also uses the radiation reflection generated by the observed target to obtain images. Meanwhile, shortwave infrared cameras can also generate images similar to infrared thermal imagers by utilizing the thermal radiation generated by the tested target. According to the above functional description, the testing of shortwave infrared cameras can be based on the principles of testing TV/LLLTV cameras or infrared thermal imagers. The parameters of InGaAs FPAs can also be used to characterize shortwave infrared cameras.
    The ST testing system uses a series of different targets to project standard target graphics onto the tested shortwave infrared camera. The distorted target images generated by the shortwave infrared camera are collected by a computer and the important parameters of the shortwave infrared camera are calculated subjectively by the human eye or software. The ST testing system includes a reflective parallel light tube, a bandwidth light source, a medium temperature blackbody, a rotating target wheel, a set of targets, and a set of filters, PC, Composed of an image acquisition card and testing software.
    Feature:

    1、 Support simulating three different scenarios:
    1) Reflective multi-color radiation structure (system uses SAL light source);
    2) Emission radiation configuration (system uses MTB medium temperature blackbody);
    3) Single color light source configuration (SAL light source configuration with bandpass filter).
    2、 Support testing of short wave infrared cameras with an optical aperture not exceeding 100mm;
    3、 Support simulating dark night environments and bright daytime environments;
    4、 The temperature that supports simulating targets can reach up to 600oC;
    5、 Module: CDT1000 collimator, SAL light source, MTB-2D medium temperature blackbody, MRW-8 rotating target wheel, one set of targets, 1550nm bandpass filter plate, image acquisition card, MTB control program, SAL control program, TAS-S program;
    6、 Computerized testing system, semi-automatic testing of important parameters of shortwave infrared cameras;
    1) Mode I: Resolution, MRC (Minimum Resolution Contrast), MTF (Transfer Function), Distortion, FOV (Field of View), Sensitivity, SNR (Signal to Noise Ratio), NEI (Noise Equivalent Input), FPN (Fixed Pattern Noise), Non Uniformity, etc;
    2) Mode II: MRTD (minimum detectable temperature difference), MDTD (minimum detectable temperature difference), MTF (adjusted to transfer function), NETD (noise equivalent temperature difference), FPN (fixed pattern noise), etc;
    3) Mode III: Mean Detectivity, Noise Equivalent Irradiance, Noise, Dynamic Range, etc.