Impedance analyzer

Impedance analyzerOverviewGDAT-S is a compact and portable device with multiple functions and higher testing frequency, making it easy to put on shelves for use. The basic accuracy of this series of instruments is 0.05%, with a testing frequency of 87 and resolutions of 1MHz and 10mHz. The 4.3-inch LCD screen, combined with a Chinese and English operating interface, is easy and simple to operate. Integrated transformer testing function and balance testing function, improving testing efficiency. The instrument provides rich interfaces that can meet various requirements for automatic sorting testing, data transmission, and storage.

Impedance analyzerDielectric constant dielectric loss tester is an instrument used to measure the dielectric constant and dielectric loss of dielectric materials. In the application of dielectric materials, dielectric constant and dielectric loss are two very important parameters that can reflect the dielectric and electrical properties of the material. Therefore, the dielectric constant dielectric loss tester has a wide range of applications in materials science, electronic engineering, communication engineering, and other fields.

The basic principle of the dielectric constant dielectric loss tester is to calculate the dielectric constant and dielectric loss by measuring the response of the dielectric material under an alternating electric field. During the testing process, the instrument applies an alternating electric field to the dielectric material and measures the material's response to the electric field. By analyzing these responses, the instrument can calculate the values of dielectric constant and dielectric loss.

The main features of the dielectric constant dielectric loss tester include:

High precision measurement: This instrument adopts excellent measurement techniques and algorithms, which can achieve high-precision measurement of dielectric constant and dielectric loss.

Automated operation: This instrument has an automated operating system, and users can complete testing through simple operations.

Multifunctional: This instrument can not only measure dielectric constant and dielectric loss, but also be used for measuring other related parameters.

High reliability: The instrument adopts a stable and reliable design and materials, ensuring the accuracy and stability of the test results.

In the field of materials science, dielectric constant and dielectric loss testers are mainly used to study the dielectric and electrical properties of materials. Through the testing of this instrument, researchers can gain a deeper understanding of the relationship between the microstructure and dielectric properties of materials, providing important experimental evidence for the development of new materials.

In the field of electronic engineering, dielectric constant dielectric loss testers are mainly used to test the performance of electronic components. Through the testing of this instrument, the dielectric and electrical properties of electronic components can be quickly and accurately evaluated, providing important technical support for the design and production of electronic products.

In the field of communication engineering, dielectric constant dielectric loss testers are mainly used to study the electromagnetic wave propagation characteristics of wireless communication devices. Through the testing of this instrument, we can gain a deeper understanding of the propagation laws and attenuation characteristics of electromagnetic waves in communication media, providing important experimental basis for the optimization design of communication equipment.

In addition to its applications in materials science, electronic engineering, and communication engineering, the dielectric constant dielectric loss tester can also be applied to other fields involving dielectric materials, such as power engineering, biomedicine, etc. Through the testing of this instrument, researchers in related fields can gain a deeper understanding of the dielectric and electrical properties of materials, providing important technical support for the development of related fields.

In short, the dielectric constant dielectric loss tester is a very important experimental instrument widely used in multiple fields. Through the testing of this instrument, researchers can gain a deeper understanding of the dielectric and electrical properties of materials, providing important technical support for the development of related fields. With the continuous advancement of technology and the increasing demand for applications, dielectric constant dielectric loss testers will play a more important role in the future.

Performance Characteristics4.3-inch TFT LCD display with optional operation interface in both Chinese and English, 87 high 1MHz test frequency, 10mHz resolution

Balance testing function, transformer parameter testing function87 high testing speed: Automatic Level Adjustment (ALC) function with 13ms/time voltage or current, V and I testing signal level monitoring function, internal built-in DC bias source, external high current DC bias source, 10 point list scanning test function, 30 Ω, 50 Ω, 100 Ω optional internal resistance, built-in comparator, 10 level sorting and counting function, internal file storage and external USB file saving. Measurement data can be directly saved to USB RS232C, USB, LAN, Handler, GPIB, DCI interfaces

Technical parameter display480 × RGB × 272, 4.3-inch TFT LCD display. Test signal frequency: 20Hz-1MHz 87 small resolution: 10mHz, 4-digit frequency Input accuracy: 0.01% AC level Test signal voltage range: 10mV-2Vrms Voltage 87 small resolution: 100 μ V, 3-digit input accuracy ALC ON 10% x set voltage+2mVALC OFF 6% x set voltage+2mV Test signal current range: 100 μ A-20mA Current 87 small resolution: 1 μ A, 3-digit input

accuracyALC ON 10% x Set current+20 μ AALC OFF 6% x Set voltage+20 μ ADC bias voltage Source voltage/current range: 0V - ± 5V/0mA - ± 50mA Resolution: 0.5mV/5 μ A Voltage accuracy: 1% x Set voltage+5mVISO ON: Used for testing inductance and transformer bias AC source internal resistance ISO ON: 100 Ω ISO OFF: 30 Ω, 50 Ω, 100 Ω Optional DCR source internal resistance: 30 Ω, 50 Ω, 100 Ω Optional impedance test parameters: | Z |, | Y |, C, L, X, B, R, G, D, Q, θ, DCR, Vdc Idc Test page parameters display: a set of main and auxiliary Parameters; 10 point list scanning transformer test parameters: DCR1 (primary, 2 terminals), DCR2 (secondary, 2 terminals), M (mutual inductance), N, 1/N, Phase (phase), Lk (leakage inductance), (primary and secondary capacitance), balance test

Basic measurement accuracy impedance test parameters: 0.05% N: 0.1% Calibration conditions Preheating time: ≥ 30 minutes; Environmental temperature: 23 ± 5oC; Signal voltage: 0.3Vrms-1Vrms; Clear "0": after OPEN and SHORT; Test cable length: 0 m Measurement time (≥ 10 kHz): Fast: 13 ms/time, Medium: 67 ms/time, Slow: 187 ms/time, plus display character refresh time LCR parameter display range | Z |, R, X, DCR: 0.0001 Ω -99.9999 M Ω| Y|,G,B：0.00001μs — 99.9999sC：0.00001pF — 9.99999FL：0.00001μH — 99.9999kHD：0.00001 — 9.99999Q：0.00001 — 99999.9θ(DEG)：-179.999o — 179.999oθ(RAD)：-3.14159 — 3.14159Δ%：-999.999% — 999.999% Equivalent circuit: series, parallel. Range mode: automatic, hold trigger mode: internal, manual, external. Bus average times: 1-256

Calibration function: Open circuitShort circuit full frequency and point frequency calibration, load calibration mathematical operations: direct reading, Δ ABS, Δ% delay time setting: 0-999, 87 small resolution 100us comparator function 10 level sorting, BIN1~BIN9, NG, AUX level counting function

PASS and FAIL front panel LED display

List scanning10 point list scanning can scan and test frequency, AC voltage/current, and internal/external DC bias voltage/current. Each scanning point can be sorted separately. Internal non-volatile memory: 100 sets of LCRZ instrument setting files, 201 test results. External USB memory GIF image LCRZ instrument setting file test data is directly stored in USB memory

interfaceI/O interface: Handler, output from the instrument rear panel Serial communication interface: USB, RS232C Parallel communication interface: GPIB interface (optional) Network interface: LAN Memory interface: USB HOST (front panel) Bias current source control interface DCI

useThe DCI interface can control an external DC bias current source, with a bias current of up to 87 and a maximum of 120A.

Options,DCI and GPIB can only choose one of the two. General technical parameters: working temperature and humidity: 0 ℃ -40 ℃, ≤ 90% RH

Power supply voltage220V ± 20%, 50Hz ± 2Hz power consumption 87 large 80VA volume (W × H × D): 280 mm × 88 mm × 370 mm (without sheath), 369 mm × 108 mm × 408 mm (with sheath). Weight: Approximately 5kg

Panel IntroductionGDAT-S front panel introduction: Trademark and model: Instrument trademark and model [COPY] key: Image save key, saving test result images to USB memory. [MAAS] menu key: Press the [MAAS] key to enter the corresponding test display page for the instrument measurement function. [SETUP] menu key: Press the [SETUP] key to enter the instrument function settings and corresponding test settings page.

[SYSTEM] menu key: Press the [SYSTEM] key to enter the system settings page.

Numerical keys: Numerical keys are used to input data into the instrument. Numerical keys are composed of numeric keys[0] to [9], composed of decimal point [.] and [+/-] keys.

[ESC] key: Exit key. [←] key: BackSPACE key. Press this key to delete the number after 87 when entering a numerical value. PASS indicator light: Test judgment qualified LED indicator FAIL indicator light: Test judgment poor LED indicator [RESET] key: Press the [RESET] key to terminate the scan only during automatic transformer scanning, and the instrument will not perform any operations on other pages.

[TRIGGER] key: When the triggering mode of the instrument is set to MAN mode, press this key to manually trigger the instrument. [ENTER] key: The [ENTER] key is used to terminate data input, confirm and save the data displayed on the input line (the line below LCD 87). UNKNOWN: A four terminal test terminal used to connect a four terminal test fixture or test cable for measuring the tested component.

current excitation(Hcur)； Voltage sampling (Hpot); Low end voltage sampling (Lpot); Current excitation low-end (Lcur).

Case grounding terminal: This terminal is connected to the instrument case. Can be used to protect or shield grounding connections. cursor keys (CURSOR): The cursor keys are used to move the cursor between fields on the LCD display page. When the cursor moves to a certain field, the field appears on the LCD screen

Highlight on the display screen.

Soft keys: Six soft keys can be used to select controls and parameters, with corresponding function definitions on the left side of each soft key. The definition of soft keys varies depending on the displayed page. Record key (LOG): This key automatically records test data after inserting a USB drive into the MEAS interface and saves system settings in SYSTEM.

LCD display screen: 800x480 color TFT LCD display screen, displaying measurement results, measurement conditions, etc. Power switch: Power switch. key: The key is used to allow or disable the output of 0-100mA/10V DC bias power supply. Press the key,

The button will be illuminated, indicating that DC bias output is allowed; Press againThe button will turn off,

Indicates the prohibition of DC bias output. Some cannot be addedThe non test screen of DC BIAS will have no response when pressed.

[KEYLOCK] key: Press the [KEYLOCK] key, and it will light up, indicating that the current panel button function is locked; Press the [KEYLOCK] key again, and it will turn off, indicating that the keyboard is unlocked. If the password function is set to "ON", the correct password must be entered when unlocking the keyboard, otherwise the keyboard lock cannot be unlocked. When the instrument is controlled by RS232, the [KEYLOCK] button will be illuminated. Press the [KEYLOCK] key again, and the [KEYLOCK] key will turn off, indicating a return to the local unlock state of the keyboard.

USB HOST interface: used to connect USB flash drive storage for saving and calling files. key: key, this function key is reserved for future expansion use.

GDAT-S Rear Panel Introduction LAN Interface: A network interface that enables control and communication of the network system. USB Device Interface: A USB communication interface that enables online communication with a computer.

RS232C serial interface: a serial communication interface that enables online communication with a computer. Handler interface: HDL interface, which implements the sorting and output of test results.

IEEE-488 interface (optional): GPIB interface for online communication with computers.

Case grounding terminal: This terminal is connected to the instrument case. Can be used to protect or shield grounding connections.

Power socket: used for inputting AC power.

Turn on the power and plug in the three wire power plug. Note that the power supply voltage, frequency, and other conditions should meet the above regulations. Power input phase lineL、 The neutral wire N and ground wire E should be the same as the phase wire and neutral wire on the power plug of this instrument. Turn on the power and press the power switch in the lower left corner of the front panel to turn on the instrument and display the power on screen.

Display Area DefinitionGDAT-S uses a 4.3-inch widescreen TFT display screen with 65k colors. The content displayed on the screen is divided into four display areas: the page area indicates the name of the current page. Soft key area: This area is used to display the functional definitions of the soft keys. The definition of soft keys has different functional definitions depending on the position of the cursor in the field.

measurement results/Condition display area: This area displays test result information and current test conditions. Assistant display area: This area is used to display system prompt information.

The corresponding page displayed after pressing the main menu buttonWhen using the LCR measurement function with the [MAAS] key, it is used to enter the component measurement display page. The main function menu for capacitance, resistance, inductance, and impedance measurement is the start button. The function pages in this section include (use the "soft key" to select the following page functions, the same below):<Measurement Display><File Number Display><File Count Display><List Scan Display>

[SETUP] Function key This key is used to enter the various settings screens for component testing. The functional pages in this section include:<Component Test Settings><User Calibration>Limit Settings>List Settings>

The [SYSTEM] key is used to enter the system settings homepage. The main focus is on the start button of the system settings and file list function menu. The functional pages in this section are: System Settings>Network Settings>Default Settings>System Operations>

Basic operations followAfter pressing the [SETUP] key, the<Measurement Page>will be displayed. Use the cursor keys ([←] [→] [↑] [↓]) to move the cursor to the desired setting position. For example: "Function: R-X", then press the software build to change "Function: R-X" to "Function: Cp-D".

Press the cursor key again[↓], move the cursor to "Frequency: 1.00000KHz". To change the frequency value, press the number key group, select it, and then press the "ENTER" key to complete the test frequency setting. You can also use the soft key to complete the frequency addition and subtraction setting. The same method can be used to set other parameters. When a numeric key is pressed, the soft key area will display the available unit soft keys. You can press the unit soft key or the [ENTER] key to end data input. When using the [ENTER] key to end data input, the data unit is the default unit for the corresponding field parameter: Hz, V, or A. For example, the default unit for testing frequency is Hz. After setting the value, press the "MEAS" key to enter the measurement display page.

After connecting the testing fixtures related to user calibration operations, it is necessary to performAdjust "User Calibration" by pressing the menu key [SETUP] and the soft key "User Calibration" to enter the<User Calibration>page.

The open circuit, short circuit, and load correction functions on the<User Correction>page can be used to eliminate distributed capacitance, parasitic impedance, and other measurement errors. Provide two calibration methods. One method is to use insertion to perform open circuit and short circuit correction on all frequency points. Another method is to perform open circuit, short circuit, and load correction on the current set frequency point.

Open circuit correctionThe open circuit correction function of GDAT-S can eliminate errors caused by stray admittance (G, B) in parallel with the tested component. The open circuit correction function operation steps include full frequency open circuit correction using insertion calculation method and single frequency open circuit correction for the two set frequency points. Perform the following steps to perform open circuit correction on the full frequency using the insertion calculation method.

Move the cursor to the open circuit setting field, and the following soft keys will be displayed in the screen's soft key area. Connect the testing fixture to the testing end of the instrument. And adjust the spacing between the two electrodes of the fixture>8mm， Not connected to any tested component.

Press the soft key Open circuit full frequency reset will measure the open circuit admittance (capacitance and inductance) at all frequency points. Open circuit full frequency correction requires approximately75 seconds of time. During the open circuit full frequency correction process, the following soft keys are displayed. Suspend this soft key to abort the current open circuit correction test operation. Keep the original open circuit correction data unchanged.

Press the soft key DCR open circuit will be measured for open circuit resistance under DC resistance function. Press the soft key to activate the open circuit correction, which will be calculated during future testing. If frequency 1, frequency 2. Set to OFF, the open circuit correction calculation uses the insertion method to calculate the open circuit correction data of the current frequency. If frequency 1 and frequency 2 are set to ON, and the current test frequency is equal to frequency 1 and frequency 2, the open circuit correction data for frequency 1 and frequency 2 will be used for the calculation of open circuit correction.

Press the soft key close Turn off the open circuit correction function. In the future measurement process, calculations for open circuit correction will no longer be performed. Short circuit correction

The short-circuit correction function of GDAT-S can eliminate errors caused by parasitic impedances (R, X) connected in series with the tested component.

Short circuit correction function operation steps: Short circuit correction includes full frequency short circuit correction using insertion calculation method and setting theSingle frequency short circuit correction performed at 2 frequency points. Perform the following steps to perform short-circuit correction on the entire frequency using the insertion calculation method.

Move the cursor to the short-circuit setting field, and the following soft keys will be displayed in the screen's soft key area.

Connect the testing fixture to the testing end of the instrument. Place a short-circuit calibration accessory between two pole piecesAdjust the electrode spacing to short-circuit the two electrodes Press the soft key to short-circuit and reset to full frequency, and all short-circuit parasitic impedances (resistance and reactance) will be measured. Short circuit full frequency correction takes approximately 75 seconds. During the short-circuit full frequency correction process, the screen displays the following soft keys.

This soft key can abort the current short-circuit correction test operation. Keep the original short-circuit correction data unchanged.

Press the soft key DCR short circuit will measure the short-circuit resistance of the DC resistance function. Press the soft key to activate the short circuit correction, and WY2818A will perform short circuit correction calculations in future testing processes. as

Fruit frequency1. Frequency 2 is set to OFF, and the short-circuit correction calculation uses the insertion method to calculate the current frequency of the short-circuit

Correct the data. If the frequencyIf frequency 2 is set to ON and the current test frequency is equal to frequency 1 and frequency 2, then

frequencyThe short-circuit correction data of frequency 2 will be used for the calculation of short-circuit correction. Press the soft key to turn off the short circuit correction function. In the future measurement process, short-circuit correction calculations will no longer be performed.

AboutComprehensive information organization of LCR bridge:

1. Basic Definition and Function

LCR bridge (digital bridge) is an electronic instrument used to measure inductance (L), capacitance (C), resistance (R), and impedance parameters. Its core functions include:

Measure the AC resistance and quality factor of components（Q）、 Parameters such as loss factor (D).

Support frequency range from power frequency to100kHz， Some models have an accuracy of up to 0.02%.

2. Working principle

Traditional bridge method: Calculate parameters by comparing the bridge balance conditions of the tested component and the standard component.

Modern digital technology: using phase sensitive detection, analog-to-digital conversion, and complex operations, breaking away from traditional bridge structures, to achieve high-precision measurement.

3. Typical application scenarios

Industrial field: used for incoming material inspection, PCB production, failure analysis, etc.

Laboratory research: Measuring the dielectric properties of magnetic materials, liquid crystal cells, and power equipment.

Alternative internal resistance tester: By connecting electrolytic capacitors in series to isolate DC interference, it can measure the internal resistance of batteries

4. Precautions for use

Environmental requirements: Preheat for 10 minutes to achieve thermal equilibrium and avoid interference from temperature and humidity.

Connection specification: During testing, it is necessary to short-circuit the cable end and ground the shielding element shell to reduce errors.

Parameter selection: Select the main parameters (L/C/R) and auxiliary parameters (Q/D) according to the measurement requirements

An electronic testing instrument used for measuring complex impedance (including amplitude, phase angle, real part, imaginary part, etc.), widely used in fields such as electronic components, materials science, biomedical and industrial testing. Its core principle is based on phase sensitive detection technology, which synchronously measures the voltage and current of the tested device, calculates impedance parameters, and supports frequency scanning and graphical display.

Main technical parameters

Frequency range: covering µ Hz to GHz (e.g. Agilent 4294A ranges from 40Hz-110MHz, while ultra-high frequency models can reach 1MHz-3GHz).

Impedance range: from µ Ω (micro ohms) to T Ω (teraohms).

Measurement accuracy: The basic accuracy can reach ± 0.05% - ± 0.08%.

Functional features: Supports multi parameter measurement of impedance, capacitance, inductance, dielectric constant, etc., and some models have temperature dependence analysis (-55 ° C to+150 ° C).

Application field

Impedance characteristic testing of electronic components: capacitors, inductors, resistors.

Materials research: analysis of dielectric constant and conductivity of piezoelectric ceramics, polymers, and biological tissues.

Industrial testing: Quality control of the production of ultrasonic transducers, buzzers, and other devices.

andThe difference between LCR testers

LCR tester: usually uses a single frequency measurement to provide fixed values for capacitance, inductance, and resistance.

Supports sweep frequency testing and can generate impedance frequency curves, suitable for dynamic characteristic analysis

Basic PrinciplesBy applyingGiven the frequency and amplitude of the AC signal to the tested component, the amplitude ratio and phase difference of its voltage and current are synchronously measured to calculate the complex impedance (real part is resistance, imaginary part is reactance). The core principle is based on Ohm's law and phase sensitive detection technology, and the specific process includes:

Signal excitation: The instrument generates a sine wave signal, which is applied to the tested object through a testing fixture.

Synchronous detection: Measure the amplitude and phase difference of voltage and current, and use phase sensitive technology to separate the real part (resistance) and imaginary part (reactance).

Parameter calculation: According to the formula Z=\ \ frac {V} {I}Z = IV

Calculate the modulus and phase angle of impedance by combining the phase difference.

Technical characteristics and measurement modes

Frequency range: covering µ Hz to GHz, such as Agilent 4294A supporting 40Hz-110MHz, high-precision models can achieve a basic accuracy of 0.05%.

Measurement mode:

Four wire Kelvin connection: eliminates the influence of contact resistance and is suitable for measuring small resistances at the milliohm level.

Sweep frequency analysis: Obtain the characteristic curve of impedance variation with frequency through frequency scanning.

Equivalent circuit model: can derive parameters such as conductivity, capacitance, inductance, etc.

Typical application scenarios

Electronic component testing: impedance characteristic analysis of capacitors, inductors, and piezoelectric ceramics.

Materials Science: Evaluating dielectric materials, battery internal resistance, etc.

Biomedical: Measurement of impedance of biological tissues (such as cellular electrical properties).

Detailed explanation of calibration steps

1. Preparation before calibration

Environmental requirements: Ensure stable temperature and humidity in the testing environment, and avoid electromagnetic interference (such as turning off wireless devices).

Equipment inspection: Confirm that the connecting wires are not loose, oxidized, or damaged, and use high-quality cables to reduce signal loss.

Preheating instrument: Preheat for 30 minutes to 1 hour after turning on to eliminate the influence of thermal drift.

2. Calibration process

Open circuit calibration: Disconnect the test fixture to place the electrode in an open circuit state, and select "Open Circuit" calibration from the instrument menu.

Short circuit calibration: Connect the electrodes to form a short circuit, select "Short Circuit" calibration, and eliminate residual impedance of the fixture.

Load calibration: Use standard resistors/capacitors (such as 100pF, 10pF) to connect fixtures and complete the "Load" calibration as prompted.

3. Verification after calibration

Standard device testing: Use standard devices with known values (such as 1000 Ω resistors) to verify whether the measurement results are within the error range.

Data recording: Save calibration data, record calibration dates, environmental conditions, and results for easy traceability in the future.

4. Precautions

Regular calibration: It is recommended to calibrate at least once a year, and the cycle should be shortened when high-frequency use or significant environmental changes occur.

Fixture compensation: If replacing fixtures or cables, recalibration is required to eliminate newly introduced parasitic parameters.

calibration cycle

The calibration cycle should be determined comprehensively based on the type of instrument, frequency of use, and accuracy requirements. The following are the key points:

Suggested cycle after calibration

After calibration, it is recommended toCalibrate once a year. If the subsequent calibration results show that the error is still within the allowable range, it can be gradually extended to 2 years, but not exceeding 5 years at the longest.

Regular inspections are required during this periodDuring the period of verification (such as quarterly or semi annual), if unstable data is found, it needs to be recalibrated immediately.

High frequency use or high-precision scenarios

If the instrument is used for high-frequency detection or for precision requirements (such as in scientific research fields), it is recommended to shorten it toOnce every six months.

After replacing critical components or repairing, recalibration is necessary.

Scientific basis for calibration cycle

The calibration cycle needs to be balancedRisk control (avoiding out of tolerance) and economy (reducing calibration costs).

Calculate the validity of the cycle based on the reference calibration implementation date (key time points in the calibration report).