FluxDancer E900 Semiconductor Parameter Analyzer

Comprehensive functions such as current voltage (IV), capacitance voltage (CV), pulse IV testing, etc;

The current measurement resolution is the highest at 0.1 fA, and the testing accuracy is 30 fA;

IV-t test mode, with a maximum fast sampling rate of no less than 65 US/point;

Supports a minimum pulse width of 10 ns in pulse mode;

Test functions: IV, IV-t, PIV (pulse IV), Super PIV (10 ns sampling) CV, impedance, 1/f (100 KHz), Super-1/f (1 MHz), Solar cell, FET, BJT, EL, etc.

High precision and high-resolution measurement capabilities;

Quick measurement and analysis, supporting multiple measurement modes;

Modular design, easy to upgrade and expand: configuration>10 slots, supporting maximum current absorption up to 4A;

Applicable electronic devices, materials, active/passive components, and other types;

Intuitive user interface, simplifying the operation process;

Support automated testing and data analysis.

I-V Source Measurement Unit (SMU)

High power SMU:

• Voltage range: ± 100 V-200V

• DC current range: ± 1A

• Pulse current range: ± 2A ± 3A

• Minimum current resolution: 0.1fA

• Minimum voltage resolution: 100nV

• Current measurement range: 10fA

• Voltage measurement range resolution: 0.5uV

• DC power: 20W or 40W optional

• Zui high pulse power: 480W (Zui high voltage 160V, Zui high current 3A)

• Minimum pulse width limit: 50 us, capable of outputting 50 us pulse test

• Support four quadrant testing

• Support 2-wire or 4-wire testing

• Support IV-T testing mode, with the fastest sampling rate of 550ns per point, and data storage points can be set to 10K, 1M, 10M, or 100M

Medium power DC SMU:

• Voltage range: ± 40- ± 50 V

• Current range: ± 1.5A

• Minimum current resolution: 400 pA

• Minimum voltage resolution: 4uV

• Current measurement resolution: 10fA

• Voltage measurement resolution: 0.5uV

• Support four quadrant testing

• Support 2-wire or 4-wire testing

Low power DC SMU:

• Voltage range: ± 14 V

• Current range: ± 40 mA

• Minimum current resolution: 200 nA

• Minimum voltage resolution: 60 uV

• Current measurement resolution: 10fA

• Voltage measurement resolution: 0.5uV

• Support four quadrant testing

• Support 2-wire or 4-wire testing

• Number of supported source tables: 1-5 optional

• Pre amplification: configurable pre amplification, SMU current measurement resolution increased to 0.1fA

C-V multi frequency capacitor unit (CVU)

• AC impedance measurement is CV, C-f, C-t

• Wide range of 1 kHz to 10 MHz, minimum frequency resolution of 1mHz

• Capacitance testing accuracy (dielectric loss D): @ 1MHz ± 0.3%, 10pF@1MHz ±0.15%, 10pF@100kHz ±0.2%

• ± 30 V (60Vpp), built-in DC bias range can be extended to ± 210V (420V differential)

• Equipped with CV and CV automatic testing and measurement functions

• Support CV, C-t capacitance measurement and scanning methods

Pulse I-V ultrafast pulse measurement unit (PMU)

• Two independent high-speed pulse IV sources and measurement channels

• 200 MSa/s, 5 ns sample interval

• ±40 V(80V p-p), ±800 mA

• Transient waveform capture mode

• Arbitrary waveform generator, 10 ns programmable resolution

High Voltage Pulse Generator Unit (PGU)

• Two high-speed pulse voltage source channels

• ±40 V(80V p-p), ±800 mA

• Arbitrary waveform generator, 10 ns programmable resolution

I-V/C-V Multi Channel Switching Module (CVIV)

• Switch between IV source and CV without lifting the probe

• Any resource CV measurement without lifting the probe

• Supports ± 210 V DC bias

1n noise testing module (FNU)

• Speed 8~10s/bias

• Bandwidth 1Hz~100kHz

• Noise base:< 120uA@2Hz

• Measurement deviation at full bandwidth of 2%