FT type thermal imager core and IR FPA testing system

FT-S configuration of FT testing system (spectral parameter measurement)

The infrared focal plane array is the most important core component of thermal imaging systems. The design of the detector circuit (core) is a key component of the thermal imaging system. Because the parameters of the infrared focal plane array determine the performance limit of the thermal imaging system, professionals in infrared focal plane technology or thermal imaging technology must have a precise understanding of the parameters of the infrared focal plane array. Therefore, measuring equipment for measuring the performance of infrared focal plane arrays is the key to developing infrared thermal imaging systems.

FT is a comprehensive testing system that generates infrared radiation with precise control over spatiotemporal distribution, which radiates to the input plane of the infrared focal plane to control the measured infrared focal plane; Finally, semi-automatic analysis is performed on the output signals required for characterizing the measured infrared focal plane array (or thermal imager core).

This system is capable of measuring all important parameters (noise/sensitivity, imaging quality, and spectral parameters) of the thermal imager core and infrared focal plane array. Can test detectors with different spectral bands (LWIR or MWIR), cooled or uncooled. The FT system can be provided in a series of versions and optimized for different testing ranges of thermal imaging cores and infrared focal plane arrays. It can also choose a super extended version that can test complete thermal imagers.

The FT measurement system is a modular system that can be easily and quickly configured into three semi independent measurement workstations: FT-N, FT-I, and FT-S.

1. FT-N - Measurement of noise and response parameters;

2. FT-I - Measurement of Imaging Quality Parameters

3. FT-S - Spectral parameter measurement.