Analysis of Metal Composition by Japanese Electronic ROHS X-ray Fluorescence Analyzer

The JSX-1000S X-ray fluorescence spectrometer adopts touch screen operation, providing more convenient and rapid element analysis. Capable of routine qualitative and quantitative analysis (FP method and detection line method), RoHS element screening function, etc.Analysis of Metal Composition by Japanese Electronic ROHS X-ray Fluorescence AnalyzerRich hardware/software options and the ability to conduct more extensive analysis.

Main features

1. Easy to operate

* Analysis of Metal Composition by Japanese Electronic ROHS X-ray Fluorescence AnalyzerJust install the sample and touch the screen.

*Touch operation can also switch the display of analysis results and spectra, as simple as using a tablet or smartphone (which can also be operated using a keyboard or mouse).

*The GUI interface is concise and easy to understand, with intuitive operation.

2. High sensitivity&high throughput

JEOL's newly developed SDD (silicon drift detector) and newly designed optical system, as well as filters that can support the entire energy range, make high-sensitivity analysis possible. Installing a sample chamber vacuum exhaust unit (optional) can improve detection sensitivity for light elements.

High sensitivity analysis across the entire energy range

The use of filters (up to 9 types *) and sample chamber vacuum exhaust units enables high-sensitivity analysis across the entire energy range.

*Cl, Cu, Mo, Sb are optional items

Example of trace element detection (below 10ppm)

3. Provide solutions

The solution application software can automatically perform the desired test analysis based on pre logged in recipes. Simply select the icon of the target solution from the list of solution application software to easily obtain analysis results, providing simplified analysis for various industries.

The newly developed intelligent FP (Basic Parameter Method) method does not require the preparation of standard samples and can automatically calibrate residual components and thickness to obtain highly accurate quantitative results.
(The residual component and thickness correction function only supports organic samples)

• （mass%）

• Main parameters

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• Range of detection elements	Mg～U
  	F~U (optional)
  X-ray generator	5～50　kV , 1mA
  target material	Rh
  Up to 9 automatic filters can be exchanged at once	Standard: OPEN, ND, Cr, Pb, Cd
  	Optional: Cl, Cu, Mo, Sb
  Three automatic exchanges of collimators	0.9mm, 2mm, 9mm
  detector	Silicon Drift Detector (SDD)
  Sample Room Size	300mmφ×80mmH
  Atmosphere in the sample room	Atmosphere/Vacuum (optional)
  Sample room observation institution	Color camera
  Operating computer	Windows ®　 Touchscreen desktop computer
  Analysis software (standard)	Qualitative analysis (automatic qualitative analysis, KLM labeling, peak display, spectrum retrieval) Quantitative analysis (block FP method, detection line method) RoHS Analysis Solution (Cd, Pb, Cr, Br, Hg) Simple analysis solution Report production software
  Analysis software (optional)	Thin film FP analysis software Correlation Filter FP Analysis Software
  Daily inspection software (standard)	Tube ball boosting, energy correction, intensity correction

• Windows ® Registered trademark or trademark of Microsoft Corporation in the United States or other countries.

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• Main attachments for metal composition analysis of Japanese electronic ROHS X-ray fluorescence analyzer:

• 1. Sample chamber vacuum exhaust unit

• 2. Multi sample automatic exchange unit

• 3. Filter bank

• 4. Filter membrane FP method analysis software

• 5. Thin film FP analysis software

• 6. Peak Elimination Software

• 7. Nickel plating screening solution

• 8. Tin plating screening solution

• 9. Solution for chlorine element screening