2600-PCT-xB parameter curve tracker configuration

NegotiableUpdate on 06/26

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Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

When configuring the 2600-PCT-xB parameter curve tracker for the development and use of MOSFETs, IGBTs, diodes, and other high-power devices, comprehensive device level characterization is required, including measurements of breakdown voltage, on state current, and capacitance parameters. Keithley's high-power parameter curve tracking configuration series can support the characterization requirements of all types of devices and various testing parameters.

Product Details

2600-PCT-xB 参数曲线跟踪仪配置

When developing and using MOSFETs, IGBTs, diodes, and other high-power devices, comprehensive device level characterization is required, including measurement of parameters such as breakdown voltage, on state current, and capacitance. Keithley's high-power parameter curve tracking configuration series can support the characterization requirements of all types of devices and various testing parameters.

Jishili's parameter curve tracking configuration includes all necessary hardware for characterization engineers to quickly build a complete testing system. The ACS basic version software that needs to be ordered separately can achieve comprehensive device characterization functions, including real-time tracking mode for quickly detecting basic device parameters such as breakdown voltage, as well as full parameter mode for extracting accurate device parameters.

The ACS basic version software surpasses the interface limitations of traditional curve trackers and provides a rich library of examples. More importantly, users have control over all testing resources, enabling them to create more advanced tests than traditional curve trackers can achieve.

2600-PCT-xB 参数曲线跟踪仪配置

Core Features

The complete solution is professionally designed to achieve cost-effectiveness

Supports on-site upgrades and reconfigurations to convert parameter curve trackers (PCTs) into reliability testing equipment or wafer sorting testers

Configurable power range:

- Voltage: 200V to 3kV

- Current: 1A to 100A

Wide dynamic range:

- Voltage: from microvolts (µ V) to kilovolts (kV)

- Current: from fA to 100A

Comprehensive capacitance voltage (C-V) testing capability:

- Capacitor: From Faradaic (fF) to Microfarad (µ F)

- Supports 2-terminal, 3-terminal, and 4-terminal devices

- DC bias up to 3kV

High performance testing fixtures that support multiple packaging types

The probe station interface is compatible with most probe types, including high-voltage triax, ultra-high voltage coaxial, standard triax, and other types

Jishili's parameter curve tracking configuration is a complete characterization tool that includes key elements required for power device characterization. Measurement channel by Jishili SourceMeter ® It consists of a source measurement unit (SMU) instrument and an optional multi frequency capacitance voltage (C-V) instrument. The dynamic range and accuracy of these instruments far exceed traditional curve trackers.

Complete system accessories

To achieve this performance, Geely has developed a complete set of precision cables for connecting instruments to Geely 8010 high-power device testing fixtures (for packaging component testing) or 8020 high-power interface panels (for wafer level testing). For high-voltage channels, customized three-axis cables provide protected pathways that can achieve fast stability and extremely low current even at full 3kV. For high current channels, specially designed low inductance cables can provide fast rise time pulses to minimize self heating effects.

2600-PCT-xB 参数曲线跟踪仪配置

High voltage capacitor - voltage (C-V)

The capacitance of testing devices is becoming increasingly important in response to changes in DC voltage. Jishili provides PCT-CVU multi frequency capacitor voltage meter. When used in conjunction with optional 200V or 3kV bias T-joints, capacitance voltage measurements can be performed on two terminal, three terminal, or four terminal devices. The measurable capacitance range is from Faraf (fF) to 100 nanofarads (nF), with a testing frequency of 10kHz to 2MHz. The ACS Basic Edition software provides over 60 preset capacitance voltage tests, including MOSFET input capacitance (Ciss), output capacitance (Coss), reverse transfer capacitance (Crss), gate drain capacitance (Cgd), gate source capacitance (Cgs), drain source capacitance (Cds), as well as a complete set of tests for bipolar junction transistors (BJTs), diodes, and other devices. As always, users can independently develop exclusive testing algorithms in ACS Basic Edition.

2600-PCT-xB 参数曲线跟踪仪配置