- Phone
-
Address
Room 207, No. 939 Jinqiao Road, Pudong New Area, Shanghai
Product Categories
Shanghai Tuzhe Electronic Equipment Co., Ltd
Zeiss ZEISS Focused Ion Beam Electron Microscope Crossbeam Series
NegotiableUpdate on 05/07
- Model
- Nature of the Manufacturer
- Producers
- Product Category
- Place of Origin
Overview
The Zeiss ZEISS focused ion beam electron microscope Crossbeam series can greatly enhance your application experience in cutting, imaging, or 3D analysis. With the Gemini electron optics system, you can obtain authentic sample information from scanning electron microscopy (SEM) images. The Ion scuttor FIB tube has introduced a new FIB processing method, which can reduce sample damage, improve sample quality, and accelerate the experimental process.
Product Details
Zeiss ZEISS Focused Ion Beam Electron Microscope Crossbeam Seriesdetailed description:
Zeiss ZEISS Focused Ion Beam Electron Microscope Crossbeam SeriesExploring New FIB Processing Methods - From Large Sizes to Nanoprecision Cutting:
Fully utilize the excellent performance of the lon sulptor FIB tube at low voltage to improve sample quality. Reducing the amorphization degree of precision samples can achieve excellent sample effects after thinning and polishing, while also having the advantage of quickly switching beam currents, accelerating the application of FIB.
You can also choose excellent high beam performance to double the acquisition speed of FIB-SEM 3D applications. The process of image acquisition is very stable to ensure that you obtain accurate and highly reproducible results. The tube design allows its beam range to span five orders of magnitude, from 1pA to 100 nA. A beam of up to 100 nA can quickly and accurately remove materials and complete the cutting process, while achieving high FIB resolution of less than 3nm under low beam conditions. When operating at an emission current of 2 μ A, the conventional lifespan of the gallium focused ion beam source, LMIS (liquid metal ion source), exceeds 3000 uAh. Through the automatic ion source heating function, Crossbeam series products are able to complete experiments with ultra long duration.
Similar Product Recommend
