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JEOL Field Emission Transmission Electron Microscope F200 from Japan
NegotiableUpdate on 05/07
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Overview
The JEOL Field Emission Transmission Electron Microscope F200 is a new generation multi-purpose field emission transmission electron microscope from JEOL, which can well meet the diverse needs of today's users. F2 adopts a user oriented integrated operation design while ensuring high performance and meeting diverse needs.
Product Details
JEOL Field Emission Transmission Electron Microscope F200 from Japandetailed description:
JEOL Field Emission Transmission Electron Microscope F200 from JapanThe appearance and operating mode of JEM-F200 have been redesigned based on the concept of "intelligence". The new human-machine interface allows users to focus on electron microscopy observation and analysis work. Thanks to Japan Electronics' years of accumulation in the field of electron optics, the new equipment adopts the high stability design concept of aberration corrected electron microscopy, which greatly improves the mechanical and electrical stability of the equipment, ensuring even better performance.
The JEM-F200 is equipped with Schottky field emission electron guns or cold field emission electron guns. High brightness and high stability field emission electron guns can greatly improve observation and analysis efficiency.
For cold field electron guns, a higher brightness and lower energy divergence electron source can be obtained, with a brightness higher than 8x108A/cm2 · sr and an energy divergence as low as 0.3eV. It is superior to Yichou in terms of image quality and analysis effect, and is more suitable for high-energy resolution EELS analysis, which can perform fine chemical binding state analysis on samples.
The JEM-F200 introduces a new four stage spotlight design that can meet the increasing demands of various applications. With the support of this new system, the first two stages of the spotlight can control the beam spot size and beam intensity, and the electron intersection formed by it can be fixed at a specific position. Then, the illumination area and convergence angle can be controlled through the last two stages of the spotlight. In addition, the parallel light illumination mode, which is very important in TEM mode imaging, can be easily achieved like traditional electron microscopes. The use of this system can easily obtain high-quality bright and dark field images.
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