Introduction

Jordan Valley Companynewly designedDelta-X is a multifunctional X-ray diffraction device that can be flexibly applied to materials science research, process development, and production quality control. The optical components of the light source stage and detection stage of the Delta-X diffractometer canAutomated control and the use of a horizontal sample stage.The Delta-X diffractometer can flexibly switch between conventional diffraction mode, high-resolution diffraction mode, and X-ray reflection mode. Switching of optical configuration completedCompleted by a computer under menu based program control, without the need for manual operation. Automated switching and alignment do not require specialized personnel or operating equipment, and ensure that each switching can achieve good resultsThe optical collimation state.

Conventional sample measurements can be conducted throughDelta-X diffractometer, partially or even completely implementedAutomated operation and automated measurement programs can be customized according to customer needs. It can also be used upManual mode operationDelta-X diffractometer is used to develop new measurement methods and study new material systems.

Data analysis or fitting can be used as part of a measurement program to achieveAutomation can also be performed separately for data analysis as needed. According to the demand of semiconductor production linesRADS and REFS fitting software run in automated mode, allowing for automatic completion of routine data analysis without user interference, and directly completing data fitting and result output. RADS and REFS can also be installed separately for more detailed data analysis.

Delta-X diffractometer can meet the needs of scientific research institutes and technology

Technology Development CenterDifferent material systemsOrientation test

Requirement.

The main features and advantages of Delta-X diffractometer

nAutomated sample alignment, testing, and data analysis

nCustomers can set the degree of automation for their own measurements

n300mm Euler Ring Bracket Cradle design, high-precision sample positioning and scanning

n300mmThe chip is horizontally placed and can be fully integratedmapping

n100 degree ChiAxis tilt range, unlimited rangePhi axis rotation space, capable of pole diagram and residual stress testing

nIntelligent optical configuration switching and collimation. Automatically select optical configuration and implement optical collimation according to measurement needs

nindustrial sectorfirstEquipment control software and data analysis software

nHigh resolution angle measuring instrument to ensure precise and accurate measurements

nHigh intensity light source stage design and optical component combination for rapid measurement

nExtensive testing techniques and measurement parameters from multiple perspectives

nHaving more than30High resolution of the yearExperience in X-ray DiffractionworldjieDesigned and manufactured by experts with expertise, possessingBall customer experience.

Characteristics and advantages of Delta-X diffractometer

Automated control optical system:

The input beam of the Delta-X diffractometer includes multiple standard optical configuration modes to provide sufficient flexibility and ease of operation for the optical configuration. Reference crystals can be selected based on the material type of the measured sample.

nStandard mode: Used for all systems, parallel beam multilayer high reflectivity mirror

nFour other optical systems can be selected and installed:

nBragg-Brentanomirror (Johannson Optical Components)

nBragg-Brentanomirror (Johannson optical element) and a reference crystal (secondary reflection)

nTwo independent reference crystals(Secondary Reflection): There are multiple designs to choose from based on the material type and resolution of the reference crystal, in order to provide and measure Matching resolution.

nTwo reference crystals, toBartels Mode Installation

nBoth reference crystals and high reflectivity mirrors can be automatically switched

nThere is no need to manually remove the reference crystal and high reflectivity mirror from the diffractometer to ensure that the optical components are not damaged or deviate from the collimated state.

nThe initial collimation of the diffractometer is easy to operate and safe Reliable, no need to turn it on inside the deviceX-ray operation.