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Suzhou Feishiman Precision Instrument Co., Ltd

  • E-mail

    huangjin@fsm-sz.cn

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    18934598975

  • Address

    JD.com, Wuzhong District, Suzhou City The Taihu Lake Intelligent Manufacturing Industrial Park (No. 7, Longshan South Road) 3A # 401-402

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Which is a good atomic force microscope

NegotiableUpdate on 01/12
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Overview
Which is a good atomic force microscope? The laser detection head and sample scanning stage are integrated, stable and reliable; Precision laser and probe positioning device, easy and convenient to replace probes and adjust light spots; ◆ Single axis drive sample automatically approaches the probe vertically, accurately locates the scanning area, and makes the needle tip perpendicular to the sample during scanning; Intelligent needle insertion method for motor controlled pressurized ceramic automatic detection, protecting probes and samples; 4X objective lens optical positioning, no need for focusing, real-time observation and positioning of probe sample scanning area; Spring suspension type shock absorption method, simple and practical, with good shock absorption effect; ◆ Metal shielded soundproof box,
Product Details

Which is a good atomic force microscope
The laser detection head and sample scanning table are integrated into one, stable and reliable;
Precision laser and probe positioning device, easy and convenient to replace probes and adjust light spots;
◆ Single axis drive sample automatically approaches the probe vertically, accurately locates the scanning area, and makes the needle tip perpendicular to the sample during scanning;
Intelligent needle insertion method for motor controlled pressurized ceramic automatic detection, protecting probes and samples;
4X objective lens optical positioning, no need for focusing, real-time observation and positioning of probe sample scanning area;
Spring suspension type shock absorption method, simple and practical, with good shock absorption effect;
◆ Metal shielded soundproof box,

Which is a good atomic force microscopeTechnical Specifications

Basic working modes: contact mode, tapping mode, F-Z force curve measurement, RMS-Z curve measurement
◆ Optional working modes: friction/lateral force, amplitude/phase, magnetic force, and electrostatic force
Sample size: Φ ≤ 90mm, H ≤ 20mm
Scanning range: 20um in XY direction, 2um in Z direction (optional 10um in XY direction, 1um in Z direction)
Scanning resolution: 0.2nm in XY direction, 0.05nm in Z direction
◆ Sample movement range: 0-13mm
Optical magnification 4X, optical resolution 2.5um
Scanning rate 0.6Hz~4.34Hz, scanning angle 0~360 °
Scan control: XY uses 18 bit D/A, Z uses 16 bit D/A
Multi-mode atomic force microscopeData sampling: 14 bit A/D, dual 16 bit A/D multi-channel synchronous sampling
Feedback method: DSP digital feedback
Feedback sampling rate: 64.0KHz
Communication interface: USB 2.0/3.0
Operating environment: Windows XP/7/8/10 operating system

Scope of application