Basic research type atomic force microscope

NegotiableUpdate on 01/12

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The basic research type atomic force microscope (FM Nanoview 1000 AFM) integrates a laser detection head and a sample scanning stage, with a very stable structure and strong anti-interference ability.

Product Details

Product Features:

◆Precision probe positioning device, laser spot alignment adjustment is very simple

◆Automatic optical positioning, no need for focusing, real-time observation and positioning of probe sample scanning area

◆The laser detection head and sample scanning table are integrated into one, with a very stable structure and strong anti-interference ability

◆Spring suspension shock-absorbing method, simple and practical, with good shock-absorbing effect

◆Single axis drive sample automatically approaches the probe vertically, scanning the needle tip perpendicular to the sample

◆Intelligent needle insertion method for motor controlled automatic detection of piezoelectric ceramics, protecting probes and samples

◆Metal shielded soundproof box, built-in high-precision temperature and humidity sensor, real-time monitoring of working environment

◆Integrated scanner non-linear correction user editor, with superior nano characterization and measurement accuracy98%

Technical Specifications:

working mode	Contact mode, tap mode	Sample table itinerary	15×15mm
Optional mode	friction/Lateral force, amplitude/phase, magnetic/electrostatic force	Optical observation	4X optical objective lens/2.5um resolution
Force spectrum curve	F-Z force curve, RMS-Z curve	scan rate	0.6Hz~30Hz
XY scanning range	20×20um，可选50 ×50um，100×100um	Scanning angle	0~360°
Z-scan range	2.5um，可选5 um，10um	runtime environment	Windows XP/7/8/10 operating system
Scanning resolution	horizontal0.2nm， Vertical 0.05nm	communication interface	USB2.0/3.0
sample size	Φ≤90mm，H≤20mm	Shock absorption design	Spring suspension/金属屏蔽箱