Research type atomic force microscope

NegotiableUpdate on 01/12

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

Research type atomic force microscope (FM Nanoview R-AFM), a high-performance and cost-effective scientific research grade AFM.

Product Details

Product Features:

◆High performance and cost-effective scientific research grade AFM

◆Support multiple working modes and multiple functional module extensions to meet the vast majority of basic scientific research applications

◆Open structure design, supporting more customized functional choices

◆XYZ three-axis independent closed-loop piezoelectric ceramic scanner, achieving high-precision positioning and high-resolution scanning measurement simultaneously

◆Closed loop piezoelectric ceramic scanning measurement does not require nonlinear correction, and its nano characterization and measurement accuracy are superior to99.5%

Technical Specifications:

scanning range	XYclosed loop100*100um，Zclosed loop10 um	System noise level	RMS≤30 pm
Scanning resolution	XYclosed loop0.2nm，Zclosed loop0.04nm	Image sampling points	highest4096*4096
scanning speed	0.1Hz~100Hz	Shock absorption method	Air floating damping platform or active damping platform
Standard imagingpattern	Contact mode, tapping mode, phase imagingsideDirectional force mode（LFM）
Mechanical measurement mode	F-ZForce curveRMS-ZCurveAdvanced force spectrum imaging、mechanicsMappingmeasurement
Electrical measurement mode	Static electric power mode（EFM）Conducting electricity力Mode（C-AFM）Kelvin probe force mode（KPFM）Piezoelectric power mode（PFM）Scanning resistance mode（SSRM）Scanning capacitor mode（SCM）
Magnetic measurement mode	Magnetic mode（MFM）TheAdjustable external magnetic field
Nano etching function	Mechanical etching, electrical etching
Environmental control function	liquidimagingMode, closed atmosphere control mode（specialGas)Integrated cold and hot temperature control mode（-20℃~200℃）、Electrochemical measurement mode
Optical auxiliary function	Compatible with stereomicroscopes、Upright metallographic microscope、Inverted biological microscope combined use