Industrial atomic force microscope

NegotiableUpdate on 01/12

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The industrial atomic force microscope (FM Nanoview LS-AFM) has almost unlimited sample size and weight, making it particularly suitable for detecting large samples such as wafers, ultra large gratings, and optical glasses.

Product Details

Product Features:

◆Realize large-scale commercial productionIndustrial atomic force microscope

The sample size and weight are almost unlimited, making it particularly suitable for testing large samples such as wafers, ultra large gratings, and optical glass

The sample stage has strong expandability and is very convenient for multi instrument combination to achieve in-situ detection

One click automatic scanning, programmable multiple testing points for fast and automated detection

When scanning the image, the sample remains stationary and the probe is drivenXYZ 3D Mobile Measurement Imaging

◆ Longmen style scanning head design, marble base, vacuum adsorption stage

Integrated mechanical vibration damping and environmental noise shielding solution, greatly reducing system noise levels

Intelligent and fast needle insertion method for automatic detection of pressurized ceramics by motor control, protecting probes and samples

◆ Scanner non-linear correction user editor, nano characterization and measurement accuracy superior to98%

Technical Specifications:

working mode	Contact mode, tap mode	Zlifting platform	Stepper motor drive control, minimum step size10nm
Optional mode	friction/Lateral force, amplitude/phase, magnetic/electrostatic force	Zliftitinerary	20mm (optional 25mm)
Force spectrum curve	F-Z force curve, RMS-Z curve	Optical positioning	10X optical objective lens
XYZscanning method	Probe drivenXYZ Scan	camera	5-megapixel digital CMOS
XYscanning range	greater than100um×100um	scan rate	0.6Hz~30Hz
Zscanning range	greater than10um	Scanning angle	0~360°
Scanning resolution	horizontal0.2nm， Vertical 0.05nm	runtime environment	Windows 10 operating system
XYSample stand	Stepper motor drive control, movement accuracy1um	communication interface	USB2.0/3.0
XYmobile itinerary	200 × 200mm (optional 300 × 300mm)	instrumentstructure	Longmen style scanning head, marble base
Sample stage	diameter200mm (optional 300mm)	Shock absorption method	Air floating shock absorber+Soundproof shielding cover (optional active shock absorber platform)
sample weight	≤20Kg