Transmission electron microscopy dual tilt probe electrical in-situ system

NegotiableUpdate on 12/14

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The transmission electron microscope dual tilt probe electrical in-situ system applies an electric field control to the sample through nano probes, combined with various modes such as EDS, EELS, SAED, HRTEM, STEM, etc., to achieve real-time and dynamic monitoring of key information such as microstructure, phase transition, elemental valence state, micro stress, and structural and compositional evolution at the surface/interface of the sample under vacuum environment.

Product Details

Our Advantages

Nanoprobe manipulation system

1. High precision piezoelectric ceramic drive,nanoscalePrecision digitization and precise positioning.

2. Single nanostructures can be manipulated and electrically measured.

Excellent electrical performance

Special design ensures low noise and accuracy in electrical measurements, with current measurement accuracy up toPian level.

Intelligent software

1. Human machine separation, software remote adjustment of electrical conditions, program automation control of tilt angle.

2. Automatically record detailed experimental data throughout the process for easy summarization and review.

Technical Specifications

category	project	parameter
Basic Parameters	Rod material	High strength titanium alloy
	Control method	High precision piezoelectric ceramics
	Tilt angle	α ≥ ± 20 °, β ≥ ± 20 ° (actual range depends on transmission electron microscope and pole shoe model)
	Applicable electron microscope	Thermo Fisher/FEI, JEOL, Hitachi
	Suitable for extreme boots	ST, XT, T, BioT, HRP, HTP, CRP
	(HR)TEM/STEM	support
	(HR)EDS/EELS/SAED	support