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E-mail
web@komegtech.cn
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Phone
139-2292-6780
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Address
No. 3, Gongye North Fourth Road, North Industrial City, Songshan Lake High tech Industrial Development Zone, Dongguan City, Guangdong Province
Product Categories
- Temperature/Humidity/Vibration Three Comprehensive Test Chamber Series
- Cold and hot (temperature) impact test chamber series
- High and Low Temperature Test Chamber Series
- Precision Industrial Oven Series
- HAST Test Chamber Series
- Environmental and climatic test series
- Rapid Temperature Change Test Chamber Series
- Step in comprehensive environmental testing chamber series
Guangdong Keming Environmental Instrument Industry Co., Ltd
Three box temperature shock box KTS-100D
NegotiableUpdate on 12/04
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Overview
Product introduction English name: 3-ZoneTermalShock Chamber Product alias: Three box temperature shock box, temperature shock testing box, vertical temperature shock box, temperature cycling shock box, 100L temperature shock box, cold shock box and other reliable environmental equipment
Product Details
Product Introduction
English name：3-ZoneThermalShockChamber
product name：Three box temperature shock box、Reliability environmental equipment such as temperature shock test box, vertical temperature shock box, temperature cycling shock box, 100L temperature shock box, cold shock box, etc.
Product UsageThis test chamber is suitable for assessing the ability of products (whole machines), components, parts, etc. to withstand sudden temperature changes. This temperature shock test can understand the impact of one or multiple consecutive temperature changes on the test sample.
Product Parameters
KOMEG can provide standard temperature shock test chambers of the "KTS" series with effective test volumes ranging from 64L to 480L,can alsoCustomize larger capacity according to customer needsThe products in this series are divided according to customer sites and different testing needsHorizontal structure、vertical structureWaiting for the box.
Application Cases：
The product meets the testing standards (methods)：
GB-2423.1-2008 (IEC68-2-1) Test A: Low temperature test method; GB-2423.2-2008 (IEC68-2-2) Test B: High temperature test method; GJBl50.3-2009 (MIL-STD-810D) High temperature test method GJBl50.4-2009 (MIL-STD-810D) Low temperature test method; GJBl50.5-2009 Temperature Shock Test Method
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