Explosion proof temperature shock box KTS-100A

English name：3-ZoneThermalShockChamber
product nameTemperature shock test chamber, temperature stress screening test chamber, temperature shock chamber, cold and hot shock testing machine, three box type cold and hot shock chamber, three slot type impact test chamber, high and low temperature impact test chamber/machine, reliability testing equipment, etc
Product Usage：
The temperature shock test chamber is an essential testing equipment in the metal, plastic, rubber, electronics and other material industries, used to test material structures or composite materials. It can withstand the degree of chemical changes or physical damage caused by thermal expansion and contraction of the sample in a continuous environment of extremely high and low temperatures in the shortest possible time, thereby assessing the environmental adaptability and overall structural performance of the product.

Product Features：
The high and low temperature cycles can reach up to 1000 times, without frosting, and the temperature recovery time is fast.
Three box structure, the sample does not need to be moved, it is easy to test cable connections, and the sample can be exposed to room temperature. Can freely switch between two temperature zone mode and three temperature zone mode.
Three static structures of test objects, with the small impact box being a vertical structureTwo box or suspended basket mobileThe medium to large size is designed with a horizontal structure, which has excellent temperature uniformity performance without any mechanical impact.

Product Parameters:

Basket style thermal cycle seriesLiquid tank impact series, large thermal shock circulation chamber, explosion-proof temperature shock series, 1m ³ thermal cycle series

Application Cases

Meet the test method (standard)：

GB-2423.1-2008 (IEC68-2-1) Test A: Low temperature test method; GB-2423.2-2008 (IEC68-2-2) Test B: High temperature test method; GJBl50.3-2009 (MIL-STD-810D) High temperature test method GJBl50.4-2009 (MIL-STD-810D) Low temperature test method; GJBl50.5-2009 Temperature Shock Test Method