Thermo Fisher Iliad aberration correction transmission electron microscope

NegotiableUpdate on 01/31

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

The Thermo Fisher Iliad aberration corrected transmission electron microscope is an integrated aberration corrected analytical electron microscope equipped with a new EELS, energy filter, Zebra detector, and NanoPulser ultrafast electrostatic beam gate, supporting the integration of Dual-X, Super-X, or Ultra-X EDX detectors.

Product Details

Introduction to Thermo Fisher Iliad aberration correction transmission electron microscopy:

The Thermo Scientific Iliad (S) TEM is equipped with a new dedicated Zebra Electron Energy Loss Spectroscopy (EELS) detector, energy filter, and a new NanoPulser ultrafast electrostatic beam gate. The Iliad electron energy loss spectrometer and energy filter have advanced optical components and high stability, and adopt multiple innovative designs that are deeply integrated with microscope optical components, helping to provide a good EELS data acquisition experience for every application. In addition, advanced integration significantly improves the maintainability of microscopes. The easy-to-use Thermo Scientific Velox software extends the collection capability of EELS data, making even challenging experiments easy for every user (including beginners) to master. Thermo Scientific Autoscript TEM software enables advanced access control to transmission electron microscopes through Python scripts, enabling the creation of new data collection workflows and the integration of artificial intelligence (AI) for customized workflows.

Thermo Fisher Iliad aberration correction transmission electron microscopeFeatures:

Iliad (S) TEM for Advanced Materials Analysis

Thermo Scientific Iliad (S) TEM utilizes advanced integrated technology to help you solve challenging scientific problems and surpass previous limitations. Advanced spectral analysis capabilities and dose optimization strategies make it an ideal choice for complex research, even for the most challenging modern materials.

Advanced optical integration enables excellent EELS performance

The challenge faced by EELS optical systems is to simultaneously transmit various electron energies from the sample to the detector through a microscope and an electron energy loss spectrometer, without introducing blurring or distortion caused by dispersion. This is a very important task, especially when trying to maintain switching between different microscope settings and different energy loss spectrum settings.

Atomic resolved EELS element distribution map of LMnO3/LaFeO3 interface.

Only by tightly integrating the optical components of the microscope and energy loss spectrometer can this be ensured, in order to match the dispersion focus in the microscope with the energy loss spectral focus. Otherwise, the excellent performance provided by the electromagnetic prism and ten multipoles can only be fully utilized in one or a few specific experimental environments, and will be lost when converted to other camera lengths, energy dispersion, or energy offset. Our EELS energy loss spectrometer and energy filter combine advanced optical components and high stability to provide an integrated transmission electron microscopy optical system to improve the EELS data acquisition experience.

The atomic resolution EELS element distribution map of TbScO3 shows Tb in green and Sc in red.

NanoPulser electrostatic electron beam valve

The use of electrostatic electron beam valves in electron microscopes can optimize electron dose. It selectively blocks the electron beam, effectively turning it on and off at high frequencies on the sample. TEMs typically use magnetic deflectors, which have a response time of only milliseconds and are not as reproducible as electrostatic deflectors. Nanopulser - an electrostatic beam valve - enables precise time control of the amount of electrons reaching the sample and supports various applications, such as dose optimization research.

When the electron beam valve operates, the traditional STEM setting (unobstructed) on the left and pulse beam scanning on the right are used to scan the sample with an electron beam, providing 50% electron beam obstruction during scanning and eliminating hysteresis signals.

Elox software

The advanced Thermo Scientific Velox software for transmission electron microscopy provides complete experimental control. It facilitates the use of scanning transmission electron microscopy (STEM and TEM) optical components and detectors, thereby improving reproducibility, yield, and support for quantitative analysis of materials using STEM and TEM.

Velox software has an integrated ergonomic user interface and ease of use, providing high-quality imaging and component mapping. The integrated SmartCam enables efficient setup of experiments. In addition, it also features an interactive detector layout interface that can be used to optimize experimental control and recording on multi detector tools. Velox software supports high contrast atomic imaging of light and heavy elements, enabling flexible STEM and TEM video recording for dynamic research.