Nexsa G2 Surface Analysis System

NegotiableUpdate on 01/31

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Nature of the Manufacturer: Producers

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Overview

The efficient electronic lens, hemispherical analyzer, and detector of the Nexsa G2 surface analysis system enable it to have detection capabilities and fast data acquisition capabilities.

Product Details

Automatic surface analysis and multifunctional X-ray photoelectron spectrometer

The Thermo Scientific Nexsa G2 X-ray photoelectron spectroscopy (XPS) system can perform fully automated, high-throughput surface analysis, providing data for advancing research and development or solving production problems. Integrating XPS with ion scattering spectroscopy (ISS), ultraviolet photoelectron spectroscopy (UPS), reflected electron energy loss spectroscopy (REELS), and Raman spectroscopy, allowing you to perform truly integrated analysis. The system now includes options for sample heating and sample bias, expanding the range of experiments that can be conducted.Nexsa G2 Surface Analysis SystemExplored the potential of materials science, microelectronics, nanotechnology development, and many other application fields.

Nexsa G2 Surface Analysis SystemMain Features

High performance X-ray source

The brand new low-power X-ray monochromator allows for the selection of analysis areas between 10 µ m and 400 µ m at intervals of 5 µ m, ensuring the collection of data from the feature regions of interest while maintaining signal quality.

Sample View

Using Nexsa XPS's optical observation system and SnapMap function to focus on the characteristic areas of the sample helps to quickly locate the regions of interest.

in-depth analysis

Obtain subsurface information using standard ion sources or MAGCIS (optional dual-mode single atom and gas cluster ion sources); The automatic calibration of ion sources and the processing of gas clusters ensure the performance and reproducibility of experiments.

Digital control

Instrument control, data processing, and reporting are all controlled by the Windows based Avantage data system.

Excellent electronic optical system

The efficient electronic lens, hemispherical analyzer, and detector enable it to have detection capabilities and fast data acquisition capabilities.

Insulation sample analysis

Dual beam neutralization source: capable of emitting both low-energy ions and low-energy electrons (less than 1 eV). In testing, it can effectively neutralize samples, especially insulation samples, making data analysis simple and reliable.

Optional Sample Stand

Provide various optional special sample stages for variable angle XPS, sample bias testing, or inert transfer of samples from glove boxes.

NX Sample Heater Module

Fully software controlled sample heating function options, supporting temperature related research.

Specifications

Analyzer type	180 ° dual focus hemispherical analyzer, 128 channel detector
X-ray source type	Monochromatic, micro focused, low-power Al K-Alpha X-ray source
X-ray spot size	10-400 µ m (adjustable in units of 5 µ m)
in-depth analysis	EX06 single atom ion source or MAGCIS dual-mode ion source
Maximum sample area	60 x 60 mm
Maximum thickness of sample	20 mm
vacuum system	Two turbo molecular pumps, equipped with automatic titanium sublimation pump and front-end pump
Optional accessories	UPS, ISS, REELS, iXR Raman spectrometer MAGCIS、 Sample tilting module, NX sample heating module, sample bias module, vacuum transfer module, glove box integrated adapter