ESCALAB QXi X-ray photoelectron spectrometer microprobe

ESCALAB QXi X-ray photoelectron spectrometer microprobeMulti technology surface analyzer providing high-resolution X-ray photoelectron spectroscopy and imaging

Thermo Scientific combines high sensitivity, high-resolution quantitative imaging, and multi technology capabilities for surface analysis ™ ESCALAB ™ The QXi X-ray photoelectron spectroscopy (XPS) microprobe will meet your needs for improving analytical performance and flexibility.

ESCALAB QXi XPS microprobe is a scalable and optimized multi technology instrument with flexibility and configurability. It is very sensitive and can produce high-quality spectra within seconds. The system control, data acquisition, processing, and reporting are seamlessly integrated into the powerful Thermo Scientific Avantage data system. The technology driven by intuitive EM software ensures results and productivity. The ESCALAB QXi XPS microprobe features a dual detector system and provides high-quality XPS imaging with excellent spatial resolution.

Characteristics of ESCALAB QXi XPS Microprobes

Monochrome XPS

The dual crystal micro focusing monochromator is equipped with a 500 mm Roland circle and uses an aluminum anode (or aluminum silver dual anode with dual monochromator option). The test spot size can be selected within the range of 200 µ m to 900 µ m.

Lens and analyzer

The lens and analyzer system on the ESCALAB QXi XPS microprobe have been optimized for spectroscopy and parallel imaging; A single analyzer path means that the same instrument parameters (such as energy) can be used for spectra and imaging.

Ion gun

The ESCALAB QXi XPS microprobe has two options for fast and high-resolution depth analysis: the standard EX06 ion gun, optimized for single particle mode ion sputtering and ion scattering spectroscopy; And optional single particle and cluster ion sources MAGCIS, which can be applied to single particle ion analysis, ion cluster analysis, and ion scattering spectroscopy analysis.

Alignment and Calibration

The standard block containing copper, silver, and gold samples can be used to evaluate sensitivity, set the linearity of the analyzer energy scale, calibrate ion sources, calibrate X-ray monochromators, and determine the conversion function of the analyzer.

Sample robotic arm

The computer-controlled 5-axis high-precision converter (HPT) can achieve accurate sample alignment for analysis. When combined with a new automatic sample loading system, it can be used to automatically replace sample racks and run preset experimental trees.

Preparation Room

The standard pre-processing chamber of ESCALAB QXi is a modular sample inlet lock and preparation chamber with ports that can accommodate various sample preparation equipment, such as heating/cooling probes, ion guns, high-pressure chambers, sample parking devices, and gas inlets.

detector

The ESCALAB QXi XPS microprobe is equipped with two detector systems: one optimized for spectroscopy, consisting of a set of six channel electron multipliers, and the other used for parallel imaging, consisting of a pair of channel plates and a continuous position sensitive detector.

Digital control

All analysis functions of ESCALAB QXi are controlled by the Avantage data system based on Windows software, which means that the entire analysis process can be remotely executed as needed.

Sample alignment

All motion axes on the sample stage of ESCALAB QXi are controlled by Avantage data system, and high-resolution digital cameras are installed on the instrument and accurately aligned with the analysis position.

vacuum system

The analysis chamber of ESCALAB QXi is composed of a 5mm thick high permeability alloy to maximize magnetic shielding efficiency, and is evacuated using turbo molecular pumps and titanium sublimation pumps to achieve a vacuum degree better than 5 x 10-10Millibars.

connectivity

The measurement coordinates can be imported from a dedicated microscope system into the Avantage data system using Thermo Scientifc Maps software, allowing for faster identification of the measurement area. XPS spectra and imaging data can be added to the Maps software for direct comparison of surface chemistry and structural information.