Excipolar SHG Second Harmonic Microscopy and Characterization System
Specially designed for applications such as nonlinear optics, two-dimensional materials, ferroelectric/piezoelectric devices, semiconductor crystals, and biological collagen imaging.
Excipolar SHG utilizes femtosecond/picosecond excitation combined with polarization maintaining confocal imaging link, combined with color separation/filtering and high-sensitivity detection, to achieve imaging and quantitative characterization of the second-order nonlinear polarizability χ (2) of the sample. The system integrates automated polarization control and power/response calibration to improve collection efficiency, suppress fundamental frequency background, and reduce instrument errors; It can complete crystal symmetry and principal axis determination, domain/anisotropy mapping, layer identification, and stress and orientation analysis with one click, and is co axial with Raman/PL to integrate imaging, spectroscopy, and polarization measurement into a one-stop process.

SHG scheme schematic diagram
Second harmonic testing systemMain Features
Polarization maintaining confocal optical path: excitation collection maintains polarization state throughout the entire link, suitable for polarization dependent SHG measurement.
Imaging and Spectral Linkage: One click switching between SHG microscopy and spectroscopy within the same field of view; Select the area for automatic spectrum collection and statistics.
Automated polarization analysis: Electric polarization/polarization detection and waveplate scanning generate polarization rose plots and P-SHG curves, supporting chi (2) tensor and point group fitting.
Dual calibration of intensity/response: power normalization and instrument response calibration are carried out in parallel to reduce system errors and ensure comparability between different batches/samples.
Multi geometry measurement: Reflection, transmission, and surface SHG can be freely switched, supporting angular resolution and Z-scan to obtain phase matching and interface information.
• Coaxial coupling: coaxial with Raman/PL, no need to readjust the optical path, mutual verification of spectra, forming a one-stop characterization process.
Efficient color separation and filtering: Strong suppression of fundamental frequency, priority transmission of second harmonic, significantly improving signal-to-noise ratio and weak signal visibility.
• Preview and alignment friendly: real-time preview of camera channel, micro area alignment and large field of view stitching; Compatible with 2D material transfer/characterization platform.
Process oriented software: One click measurement, batch processing, and report export, with built-in script interfaces for automation and secondary development.
• Safety and Expansion: Power interlocking and low-dose workflow ensure sample safety; Optional THG/EFISHG, temperature control, electric field/stress loading modules are plug and play.
Second harmonic testing systemApplication fields:
Two dimensional materials: layer number and symmetry determination, crystal axis and twist angle measurement, domain structure and stress orientation mapping
• Ferroelectric/piezoelectric devices: domain structure and inversion boundary imaging; In situ SHG changes under external electric field
Semiconductor/photonic devices: evaluation of crystal orientation and interface quality of LN/GaN/AlN and other materials
Surface and Interface: In Situ S-SHG Dynamic Monitoring of Adsorption/Functionalization/Oxidation Processes
Biology and Soft Matter: Structural Imaging and Anisotropy Analysis of Collagen and Other Materials Without Staining

SHG intensity plot of CdSe under 1550nm excitation