Scios 2 DualBeam Focused Ion Beam Scanning Electron Microscope

NegotiableUpdate on 01/31

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Overview

Scios 2 DualBeam Focused Ion Beam Scanning Electron Microscope is used for ultra-high resolution, high-quality sample preparation, and 3D characterization.

Product Details

Scios 2 DualBeamFocused ion beam scanning electron microscope for ultra-high resolution, high-quality sample preparation and 3D characterization

Thermo ScientificScios 2 DualBeamIt is a high-resolution analytical focused ion beam scanning electron microscope (FIB-SEM) system that provides excellent sample preparation and 3D characterization performance for various samples, including magnetic and non-conductive materials. Through innovative functional design, flux, accuracy, and ease of use have been improved, making it an ideal solution to meet the advanced research and analysis needs of scientists and engineers in academic, government, and industrial research fields.

Scios 2 DualBeamFocused ion beam scanning electron microscopeKey Features:

Quick and convenient preparation

Obtain high-quality, field specific TEM and atomic probe samples using Sidewinder HT ion columns.

Complete sample information

Obtain clear, accurate, and charge free contrast through various integrated chromatography column and lens detectors.

Accurate sample navigation

The highly flexible 110 mm stage and Thermo Scientific Nav Cam camera inside the chamber allow customization according to specific application requirements.

Optimize your solution

Flexible DualBeam configuration, including optional low vacuum mode with chamber pressure up to 500 Pa, to meet specific application requirements.

Obtain high-quality, field specific TEM and atomic probe samples using Sidewinder HT ion columns.

Ultra high resolution imaging

Use Thermo Scientific NICol electron chromatography columns with performance across a wide range of samples, including magnetic and non-conductive materials.

High quality, multi-mode subsurface and 3D information

By using the optional AS&V4 software, high-quality, multi-mode subsurface and 3D information can be obtained by precisely targeting the region of interest.

No artifact imaging and pattern formation

Has dedicated modes such as DCFI, drift suppression, and Thermo Scientific SmartScan modes.

Specifications

Electron beam resolution	Best WD 0.7 nm at 30 keV STEM 1.4 nm at 1 keV 1.2 nm at 1 keV (beam deceleration)
Electron beam parameter space	Electron beam current range: 1 pA to 400 nA Landing energy range: 20 * eV – 30 keV Acceleration voltage range: 200 V-30 kV Maximum horizontal field width: 3.0 mm at 7 mm WD and 7.0 mm at 60 mm WD Can provide ultra wide field of view (1x) through standard navigation editing
Ionic optical system	Acceleration voltage: 500 V-30 kV Electron beam current range: 1.5 pA-65 nA 15 position aperture strip Drift suppression mode, the standard mode for non-conductive samples Minimum ion source lifespan: 1000 hours Ion beam resolution: 3.0 nm at 30kV using the angle selection method
detector	Trinity detection system (inside the tube and chromatography column) T1 segmented lower tube detector T2 upper tube internal detector T3 scalable chromatographic column detector (optional) Up to 4 signals detected simultaneously Everhart Thornley SE detector (ETD) High performance ion conversion and electron detector (ICE) for secondary ions (SI) and secondary electrons (SE) (optional) Scalable, low voltage, high contrast, segmented, solid-state backscatter electron detector (DBS) (optional) Scalable STEM 3+detector with BF/DF/HAADF segmentation (optional) View IR cameras for samples and chambers Indoor Nav Cam sample navigation camera (optional) Integrated beam current measurement
Stage and sample	Flexible 5-axis electric platform: XY range: 110 mm Z range: 65 mm Rotation: 360 ° (infinite) Tilt range: -15 ° to+90 ° XY repeatability: 3 μ m Maximum sample height: 85mm from the centroid Maximum sample weight at 0 ° tilt: 5 kg (including sample holder) Maximum sample size: 110 mm when rotated (larger samples are also possible, but rotation is limited) Calculate center rotation and tilt