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Tiankong Scientific Instruments (Shanghai) Co., Ltd
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Tiankong Scientific Instruments (Shanghai) Co., Ltd

  • E-mail

    Wayne.Zhang@Sikcn.com

  • Phone

    13917975482

  • Address

    7th Floor, Building 7, Zhangjiang Microelectronics Port, No. 690 Bibo Road

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OMRON High Speed Automated 3D-CT Inspection System (AXI)

NegotiableUpdate on 01/13
Model
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Producers
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Place of Origin
Overview
As a high-speed and high-quality inspection device using full 3D-CT, VT-X750 is widely used for non-destructive inspection of 5G infrastructure/modules and on-board electrical components, as well as in aerospace, industrial equipment, semiconductor and other fields. In recent years, this model has been used for inspecting power devices such as IGBT and MOSFET in electric vehicles, internal bubbles in soldering of mechatronics products, and soldering filling of through-hole connectors.
Product Details

OMRON 高速自动化3D-CT检测系统(AXI)

As a fully adoptedThe high-speed and high-quality inspection device of 3D-CT, VT-X750, is widely used for non-destructive inspection of 5G infrastructure/modules and on-board electrical components, as well as aerospace and industrial applicationsIndustries such as equipment and semiconductors. In recent years, this model has been used for electric vehiclesInternal bubbles and through holes in the solder of power devices such as IGBT and MOSFET, as well as mechatronics productsInspection of solder filling and other related aspects of connectors

Applicable products:OMRON 高速自动化3D-CT检测系统(AXI)

BGA/CSPInsert componentsSOP/QFPTransistorsR/CChips, bottom electrode componentsQFNPower modulePOPThepress-fitConnectors, etc

Inspection items:

Bubbles, open soldering, non wetting, solder quantity, offset, bridging, solder crawling, through-hole solder filling, solder beads, etc(Can be selected based on the inspection object)

core value:

✓ OnlineFull board high-speed scanning

Industry leaders3D-CT technology, realizing whole board components (including BGA/connectors/chips, etc.)online100% non-destructive testing, with a speed comparable to previous generation models(VT-X700)More than twiceFull inspection of M-sized substrates only takes minutes (including 2000+pins BGA/SiP)

OMRON 高速自动化3D-CT检测系统(AXI) Visualization of solder strength

Du HomeThe 3D-CT algorithm accurately quantifies the shape of solder, achieving:

Solder bubbles/Virtual soldering/bridging/tin crawling, etcMicron level defect detection

Quick quality verification during production switching to eliminate design constraints

AI intelligent assistance system

✓ Safety zero stop line guarantee

• Automatic judgmentOK/NG (AI+quantitative double standard)

Radiation reduction technology (standard filter)+High speed scanning

Intelligent generation detection program(Automatic Conversion of CAD Data

• Component radiation simulator predicts risks

• Optimal parameter simulation (beat)/Radiation adaptive optimization)

Global remote monitoring support

OMRON 高速自动化3D-CT检测系统(AXI)

Technical specifications:

project

content

model

VT-X750

VT-X750-XL

type

V3-H

V3-C

V2-H

Shooting resolution

6~30μ m adjustable

6~30μ m adjustable

10~30μ m adjustable

Object substrate

Substrate size

50×50610×515mm

Thickness0.45.0mm (resolution3μmtime0.43.0mm)

100×501200×610mm

Thickness0.415.0mm

Substrate weight

4.0kgBelow8.0kgbelow(※ Options)

15kgbelow

warp

2.0mmbelow(resolution3μmtime1.0mmbelow)

3.0 mmbelow