Multi functional four probe/four point probe tester

Multi functional four probe/four point probe testerThis instrument adopts a 4.3-inch large LCD screen display, which simultaneously displays resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity. Different testing fixtures can be configured to meet the testing requirements of different materials. Testing fixtures can be selected according to product and testing project requirements

FT-361 ultra-low resistanceDual electric four probetester

1、 Overview: This product is designed to solve the problem of measuring the square resistance and resistivity of ultra-low resistance materials using the four probe method. It can achieve a minimum resistance value of 1u Ω, which is currently the smallest value that can be measured in the same industry. It is controlled by a high-precision AD chip, with constant current output, reasonable structure, lightweight, safe transportation, and convenient use; Suitable for production enterprises, universities, and research departments, it is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials. This instrument is equipped with various measuring devices to test different materials. LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Optional: Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports;

Multi functional four probe/four point probe testerVery current source output, can simultaneously display resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity; Ergonomic design principles, using a four probe probe in conjunction with a testing platform; Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports;

Multi functional four probe/four point probe testerVery current source output, can simultaneously display resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity; Ergonomic design principles, using a four probe probe in conjunction with a testing platform; Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports; It is the use of linear or square four probe dual position measurement. The instrument design complies with the physical testing method standards for single crystal silicon and references the American A.S.T.M standards. By using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed using dual electrical measurements. This automatically eliminates the influence of sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results. Compared with single electrical measurement linear or square four probe probes, it greatly improves the accuracy, especially suitable for testing micro areas with oblique four probe probes. Purchase: This machine can also be used in conjunction with various environmental temperature test chambers, and different measuring fixtures can be used to meet the needs of measuring square resistance and resistivity at different environmental temperatures

2、 Widely used for: covering film; Conductive polymer film, high and low temperature electric heating film; Thermal insulation, radiation proof conductive window film, conductive (shielding) cloth, decorative film, decorative paper; Metallized labels, alloy foil films; Melting, sintering, sputtering, coating, coating layers, resistive and capacitive touch screen films; Resistance testing of electrode coatings, other semiconductor materials, and thin film materialsSilicon block, chip resistivity and diffusion layer, epitaxial layer, ITO conductive foil film, conductive rubber and other materials, block resistance semiconductor materials/Wafers, solar cells, electronic components, conductive films（ITOConductive film glass, metal film, conductive paint film, evaporated aluminum film, etc,PCBCopper foil film,EMIThin layer resistance and resistivity of coatings and other substancesConductive paint, conductive paste, conductive plastic, conductive rubber, conductive film, metal film, anti-static material, EMI protection material, conductive fiber, conductive ceramic, etc

IIIMulti functional four probe/four point probe testerparameter data

1.Block resistance range:10^-6～2×10²Ω/□

2.Range of resistivity:10^-7～2×10³CM

3.Test current range: 0.1 μ A, 1 μ A, 10 μ A, 100 µ A

4.Current accuracy: ± 0.1% reading

5.Resistance accuracy:≤0.3%

6.Display reading:LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity

7.Testing method: Dual electric measurement

8.Working power supply: Input: AC 220V ± 10%, 50Hz Power consumption:<30W

9.Uncertainty error of the whole machine:≤4%(Standard Sample Results)

10.Selection function: Choose 1. PC software; 2. Square probe; 3. Linear probe; 4. Testing Platform

11.Test probe: Probe spacing selection: 1mm; 2mm; Three specifications of 3mm; Probe material selection: tungsten carbide needle; White steel needle; Gold plated phosphor copper hemispherical needle

Multi functional four probe/four point probe tester