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Ningbo Ruike Micro Intelligent Technology Co., Ltd
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Ningbo Ruike Micro Intelligent Technology Co., Ltd

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    8th Floor, Building 14, Jinshan Zhiyuan Garden, No. 199, Lane 520, Tongning Road, Qianjiang Street, Jiangbei District, Ningbo

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Four probe tester

NegotiableUpdate on 05/06
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Overview

The FT-371 four probe tester can be used in conjunction with various environmental temperature test chambers, and can meet the needs of measuring square resistance and resistivity at different environmental temperatures through different measuring fixtures Adopting high-precision AD chip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Suitable for production enterprises, universities, and research departments, it is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials.

Product Details

FT-371Four probe testerIt is an instrument designed for product performance testing, with strong practicality. Ruike Instrument has been developing new products. If you are interested in our instrument, please feel free to take a look at the performance and parameters of the new product.

I. Overview

This product is designed to solve the problem of measuring the square resistance and resistivity of ultra-high resistance materials using the four probe method. It can test up to 1010 Ω square resistance, which is currently the largest square resistance value that can be measured in the same industry. Optional: This machine can also be used with various environmental temperature test chambers, and different measuring fixtures can be used to meet the needs of measuring square resistance and resistivity at different environmental temperatures Adopting high-precision AD chip control, constant current output, reasonable structure, lightweight quality, safe transportation, and convenient use; Suitable for production enterprises, universities, and research departments, it is an important tool for inspecting and analyzing the quality of conductor and semiconductor materials. This instrument is equipped with various measuring devices to test different materials.

LCD display, no need for manual calculation, with temperature compensation function, automatic selection of resistivity unit, instrument automatic measurement and automatic range conversion based on test results, no need for manual multiple and repeated settings. Optional: Equipped with software that can be controlled by a computer, saving and printing data, and automatically generating reports; This instrument adopts a 4.3-inch large LCD screen display, which simultaneously displays resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity. Different testing fixtures can be configured to meet the testing requirements of different materials. Testing fixtures can be selected according to product and testing project requirements.

Dual electric measurement digitalFour probe testerIt is the use of linear or square four probe dual position measurement. The instrument design complies with the physical testing method standards for single crystal silicon and references the American A.S.T.M standards. By using the transformation of current probes and voltage probes, two electrical measurements are taken, and the data is analyzed using dual electrical measurements. This automatically eliminates the influence of sample geometry, boundary effects, probe misalignment, and mechanical drift on the measurement results. Compared with single electrical measurement linear or square four probe probes, it greatly improves the accuracy, especially suitable for testing micro areas with oblique four probe probes.

2、 Application

FT-371Four probe testerWidely used for covering films; Conductive polymer film, high and low temperature electric heating film; Thermal insulation, radiation proof conductive window film, conductive (shielding) cloth, decorative film, decorative paper; Metallized labels, alloy foil films; Melting, sintering, sputtering, coating, coating layers, resistive and capacitive touch screen films; Thin layer resistance and resistivity testing of electrode coatings, other semiconductor materials, thin film materials, silicon crystal blocks, chip resistivity and diffusion layers, epitaxial layers, ITO conductive foil films, conductive rubber and other materials. Block resistance semiconductor materials/wafers, solar cells, electronic components, conductive films (ITO conductive film glass, etc.), metal films, conductive paint films, evaporated aluminum films, PCB copper foil films, EMI coatings and other substances. Conductive paints, conductive pastes, conductive plastics, conductive rubber, conductive thin films, metal thin films, anti-static materials, EMI protective materials, conductive fibers, conductive ceramics, etc.

3、 Parameter data

1. Block resistance range: 101~2 × 1010 Ω/□.

2. Range of resistivity: 102~2 × 1011 Ω - cm.

3. Test current range: 1mA to 1pA.

4. Current accuracy: ± 0.1% reading.

5. Resistance accuracy: ≤ 5% below 108 Ω; Above 108 Ω ≤ 20%.

6. Display reading: LCD display: resistance, resistivity, square resistance, temperature, unit conversion, temperature coefficient, current, voltage, probe shape, probe spacing, thickness, conductivity.

7. Testing method: Dual electric measurement.

8. Working power supply: Input: AC 220V ± 10%, 50Hz Power consumption:<30W.

9. Uncertainty error of the whole machine: ≤ 4% (standard sample result).

10. Selection function: Choose 1. PC software; 2. Square probe; 3. Linear probe; 4. Testing platform.

11. Test probe: Probe spacing selection: 1mm; 2mm; Three specifications of 3mm; Probe material selection: tungsten carbide needle; White steel needle; Gold plated phosphor copper hemispherical needle.