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Multi channel current matrix module resistivity/leakage current testing

NegotiableUpdate on 12/30
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Overview

Multi channel current matrix module resistivity/leakage current testing is a modular, high-density current control solution that supports independent control of multiple current channels (typical 8~128 channels) and can simultaneously output/draw precise and adjustable DC currents.

Product Details



Multi channel current matrix module resistivity/leakage current testing



Product Introduction

The multi-channel current switching matrix module is a modular, high-density current control solution that supports independent control of multiple current channels (typical)8~128 channels), capable of simultaneously outputting/inhaling precise and adjustable DC current. Through an excellent matrix switch architecture, users can freely configure the current values (pA to mA level), working modes (constant current/pulse/scan), and on/off timing of each channel, suitable for parallel testing, automated production lines, and complex experimental scenarios. tallofThe precision multi-channel current switching matrix module is designed for demanding weak currents (as low as picoampere level) and medium currents (up to)A core component designed for switching signal paths (100mA). It does not measure current itself, but rather serves your needsofPrecision electrostatic meter (such as Keithley 6517B, 6430, 6485/6487) or source measurement units provide reliable, low-noise, and low thermal electromotive force (EMF) channel expansion capabilities, enabling a single expensive highofExpansion of precision instruments into efficient multi-channel automated testing systems. Whether it is material characteristic analysis in R&D laboratories or batch testing of semiconductor devices on production lines, they are ideal choices for improving testing efficiency and ensuring data consistency.


Multi channel current matrix module resistivity/leakage current testingProduct Features:

01High density integrationSingle box support is relatively hightall128 channels, saving 90% of equipment space and reducing cabinet and cable costs.

02 millisecond level switching;High speed matrix switch(Supports dynamic load switching and high-speed scanning testing with a switching time of 20ms.

03 Modular ExpansionSupports hot swappable channel cards and can expand the number of channels as needed (more...)smallStarting from 8 channels, expanding in increments of 8.

04 Signal integrityLow capacitance design, supporting the rapid establishment of stable measurement signals and reducing testing time.

05 Wide current rangeThe carefully designed signal path ensures that the equipment is When switching signals within a wide dynamic range of ± 1 pA to ± 100 mA, the introduced interference and error are minimal, meeting the requirements from leakage testing of ultra-high resistance materials to analysis of general electronic component characteristics.

06 Accuracy and Low NoiseUltra-low thermal electromotive force (<1 μ V) design to eliminate the influence of thermoelectric effect on weak DC measurement. Extremely low leakage current path (<1 fA @ typical value) ensures the accuracy of pA level weak current measurement. Optimized shielding and wiring design to minimize crosstalk and external noise interference to the greatest extent possible.


Application field

l Testing of high resistance materials and components: Electrical resistivity of insulation materials, ceramics, thin films, and high resistance resistors/Automated measurement of leakage current.

l Analysis of semiconductor device characteristics: transistor/Diode leakage current (Ioff, Gate Leakage), capacitor leakage, wafer level reliability testing (WLR). Sensor testing and calibration: photodiode dark current, electrochemical/biosensor current, radiation detector current.

l Battery and energy storage testing: Battery self discharge current monitoring, module/Pack insulation resistance test.

l Static electricity andESD research: Measurement of resistivity of anti-static materials and testing of electrostatic charge decay. Optoelectronic and photovoltaic device testing: dark current of solar cells, weak leakage current of LED/OLED, and detector array testing.

l Environmental monitoring and scientific instruments: Ionization chamber current acquisition, multi-channel weak signal switching. Multi device parallel parameter testing: Cooperate with the source table for batch device productionI-V scanning, conducting resistance measurement, etc.


Application Cases

Can construct extremely powerful high channel count and high precision weak current/High resistance automated testing system.

Expanding a single expensive high-precision electrostatic meter into a multi-channel testing system significantly improves equipment utilization and testing efficiency.

Implement unmanned long-term, multi sample continuous testing to ensure data consistency and comparability.

Accurately capture weak current changes at the pA or even fA level, meeting demanding testing requirements.

多通道电流矩阵模块 电阻率/漏电流测试

Main technical indicators

l productmodelHC-PAX

l number of channels:Basic Unit8 channels, single chassis 128 channels, expandable 8 chassis 1024 channels

l current range:±1pA ~ ±100mA

l Current interfaceSplit mouth is8-core Remo, with a total port of BNC

l communication interface:RS485

l Overall dimensions:longWidth x Height 44cm x 13.5cm x 30cm (excluding all protrusions)

l Power supply requirements:100-240V AC, 50/60Hz, Single box larger 60W

l Operating Temperature10℃ ~ +50℃

l Working humidity40%~60% RH without condensation

多通道电流矩阵模块 电阻率/漏电流测试